Robert Wieland
Fraunhofer Society
27 Papers
268 Citations
Robert Wieland is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: System integration & Through-silicon via. The author has an hindex of 11, co-authored 25 publications.
Chat about Author
Papers
Through silicon via technology — processes and reliability for wafer-level 3D system integration
Peter Ramm,M. J. Wolf,Armin Klumpp,Robert Wieland,Bernhard Wunderle,Bruno Michel,Herbert Reichl +6 more
- 27 May 2008
TL;DR: The ICV-SLID fabrication process is well suited for the cost-effective production of both, high-performance applications (e.g. 3D microprocessor) and highly miniaturized multi-functional systems as mentioned in this paper.
137
InterChip via technology for vertical system integration
Peter Ramm,Detlef Bonfert,H. Gieser,J. Haufe,F. Iberl,Armin Klumpp,A. Kux,Robert Wieland +7 more
- 06 Jun 2001
TL;DR: The I_nterC_hip V_ia (ICV) as mentioned in this paper is a fully CMOS compatible wafer-scale process which provides vertical electrical interchip interconnects placed at arbitrary locations, without intervention to the IC's fabrication technologies.
71
TSV based silicon interposer technology for wafer level fabrication of 3D SiP modules
Kai Zoschke,J. Wolf,Christina Lopper,I. Kuna,N. Jurgensen,V. Glaw,K. Samulewicz,J. Roder,Martin Wilke,O. Wunsch,M. Klein,M. v. Suchodoletz,Hermann Oppermann,Tanja Braun,Robert Wieland,Oswin Ehrmann +15 more
- 20 Jun 2011
TL;DR: In this article, the fabrication steps for wafer level processing of silicon interposers with copper filled TSVs as well as their wafer-level assembly with IC components are presented, and special focus is drawn on the TSV formation process including via etching, isolation and filling, front side high density wiring and subsequent backside processing of the thin TSV wafers.
66
3D System Integration Technologies
Peter Ramm,Armin Klumpp,Reinhard Merkel,Josef Weber,Robert Wieland,Andreas Ostmann,Jürgen Wolf +6 more
TL;DR: In this paper, a low-cost fabrication approach for vertical system integration is introduced, which takes advantage of wafer level processing to avoid increasing package sizes and expensive single component assembling processes.
Chip-to-wafer stacking technology for 3D system integration
Armin Klumpp,Reinhard Merkel,Robert Wieland,Peter Ramm +3 more
- 27 May 2003
TL;DR: 3D integrated systems show reduced chip areas and enable optimized partitioning, both which decrease the fabrication cost of the system and an additional benefit is the enabling of minimal interconnection lengths and the elimination of speedlimiting inter-chip interconnects.
48