Robert Nolan
IBM
8 Papers
21 Citations
Robert Nolan is an academic researcher from IBM. The author has contributed to research in topics: Photomask & Flatness (systems theory). The author has an hindex of 4, co-authored 8 publications.
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Papers
Evaluation of 32nm advanced immersion lithography pellicles
Nancy Zhou,Kenneth C. Racette,Michael S. Hibbs,T. Mizoguchi,D. Hasselbeck,Monica Barrett,Robert Nolan,F. Houle,Jason P. Ritter,Alfred Wagner,Michael Caterer +10 more
- 24 Oct 2008
TL;DR: In this paper, advanced immersion pellicles from several suppliers are evaluated and compared with conventional 45 nm pellicle for the following quality parameters: physical durability, foreign material, ease of demounting and glue removal, chemical outgassing, mask flatness distortion and susceptibility to radiation damage.
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Effect of pellicle frame and adhesive material on final photomask flatness
Nancy Zhou,Ken Racette,David Hasselbeck,Monica Barrett,Robert Nolan,Michael Caterer,Takashi Mizoguchi,Satoshi Akutagawa,Glenn Dickey,Toru Shirasaki +9 more
- 24 Apr 2009
TL;DR: In this paper, the effect of the elasticity of the pellicle adhesives on mask flatness has been evaluated and it has been shown that a more flexible adhesive adhesive can improve the mask's flatness approximately the same amount as reducing the total frame standoff height.
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Pellicle factors affecting finished photomask flatness
Kenneth C. Racette,Andrew J. Watts,Monica Barrett,Robert Nolan,Y. Sasaki,Y. Kikuchi,T. Matsumura +6 more
- 03 May 2007
TL;DR: In this article, a comparison of the impact of various pellicle types, frame flatness, frame shape and mounting tools on final photomask flatness was shown, with the objective of demonstrating the effects of various mounting tool types and mounting type and mounting tool on the final image flatness.
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Patent
Method for reducing photo-mask distortion
Nancy Chenxin Zhou,Kenneth C. Racette,Robert Nolan +2 more
- 30 Mar 2008
TL;DR: In this article, a structure and method for reducing or eliminating the flatness distortion effects of a photomask assembly which occurs when a pellicle is mounted to the photOMask is described.
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Evaluation of easily removable pellicle adhesive
Nancy Zhou,Monica Barrett,Robert Nolan,Dennis Plouffe,Jason P. Ritter,Alfred Wagner,Michael Caterer,Takashi Mizoguchi,Satoshi Akutagawa,Kevin Duong,Corbin Imai,Changbao Wang +11 more
- 29 Apr 2010
TL;DR: In this paper, the effect of a new MLI adhesive on the distortion of photomasks is evaluated. And the results show that by using extreme low mounting pressure, benefits such as decreased flatness distortion and ease of removing adhesive removal are observed.
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