Richard A. DeVerse
12 Papers
652 Citations
Richard A. DeVerse is an academic researcher. The author has contributed to research in topics: Spectral imaging & Signal. The author has an hindex of 9, co-authored 12 publications.
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Papers
Patent
System and method for encoded spatio-spectral information processing
William G. Fateley,Ronald R. Coifman,Frank Geshwind,Richard A. DeVerse +3 more
- 28 Sep 2001
TL;DR: In this paper, a system having a radiation source, wavelength dispersion device and two-dimensional switching array, such as digital micro-mirror array (DMA), is described.
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Application of spatial light modulators for new modalities in spectrometry and imaging
TL;DR: In this article, an adaptive digitally tuned light source is disclosed, in the form of a de-dispersive imaging spectrograph in both the visible and near infrared spectral regions.
80
Patent
Devices and method for spectral measurements
Frank Geshwind,Ronald R. Coifman,Andreas Coppi,Richard A. DeVerse,William G. Fateley +4 more
- 07 Mar 2005
TL;DR: In this paper, a spectral measurement device comprising an entrance aperture for receiving an electromagnetic energy and a mask located at the entrance aperture in the form of a two-dimensional encodement pattern is described.
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Patent
Hyper-spectral imaging methods and devices
Frank Geshwind,Andreas Coppi,Richard A. DeVerse,Ronald R. Coifman,William G. Fateley +4 more
- 07 Mar 2005
TL;DR: In this article, a hyper-spectral imaging system comprises imaging foreoptics (1020) to focus on a scene or object of interest (1010) and transfer the image of said scene and object onto the focal plane of a spatial light modulator (1030), placed at a focal point of said imaging fore-optics.
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Patent
System and method for hyper-spectral analysis
Mauro Maggioni,Ronald R. Coifman,Andreas Coppi,Gustave L. Davis,Richard A. DeVerse,William G. Fateley,Frank Geshwind,Frederick Warner +7 more
- 19 Sep 2005
TL;DR: In this article, a plurality of patches of pixels from within the hyper-spectral images are extracted as being patches around pixels of the elements to be characterized or distinguished, and statistics of spectra for each patch of pixels are computed.
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