Randolf Hanke
Fraunhofer Society
88 Papers
477 Citations
Randolf Hanke is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Detector & Object (computer science). The author has an hindex of 16, co-authored 88 publications. Previous affiliations of Randolf Hanke include University of Erlangen-Nuremberg & University of Würzburg.
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Papers
X-ray based methods for non-destructive testing and material characterization
TL;DR: In this paper, the authors focus on the radioscopic-based methods related to their most important applications and demonstrate the methods including technical set-ups (X-ray source and detector), imaging and reconstruction results and the methods for high speed and high-resolution volume data generation and evaluation.
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Magnetic Particle Imaging meets Computed Tomography: first simultaneous imaging.
Patrick Vogel,Jonathan Markert,Jonathan Markert,Martin A. Rückert,Stefan Herz,Benedikt Keßler,Kilian Dremel,Daniel Althoff,Matthias Weber,Thorsten M. Buzug,Thorsten A. Bley,Walter H. Kullmann,Randolf Hanke,Simon Zabler,Volker C. Behr +14 more
TL;DR: This paper presents the first hybrid MPI-CT scanner for multimodal imaging providing simultaneous data acquisition, and it is claimed that this scanner is the first of its kind in the world.
Patent
Detection of irregularities in a convex surface, such as a tire sidewall, using band-pass filtering
Guenther Kostka,Peter Schmitt,Ulf Hasler,Randolf Hanke +3 more
- 12 Aug 1999
TL;DR: In this article, an edge-free irregularity (50b) was detected in a convex surface which comprises a structuring (50a) that is delimited by edges.
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X-ray microtomography for materials characterization
Randolf Hanke,Theobald Fuchs,Michael Salamon,Simon Zabler +3 more
- 01 Jan 2016
TL;DR: The main goal in micro-CT is to further increase the spatial resolution, while simultaneously reducing scan times and improving the contrast-to-noise ratio as discussed by the authors, which will be achieved by advanced X-ray sources with smaller focal spot sizes, by advanced detector systems with smaller pixel sizes and modern reconstruction algorithms.
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Patent
X-ray source having a small focal spot
Lothar Frey,C. Lehrer,Randolf Hanke,Peter Schmitt +3 more
- 26 Mar 2003
TL;DR: In this paper, a target device for a beam source for emitting high frequency, especially X-ray-frequency, radiation (R) from the target device (21,...,26) which can be irradiated by a particle beam (e) in order to emit the high-frequency radiation from an impact spot (12,11,15,40).
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