Peter M. A. Sherwood
University of Washington
181 Papers
1.9K Citations
Peter M. A. Sherwood is an academic researcher from University of Washington. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Oxide. The author has an hindex of 45, co-authored 181 publications. Previous affiliations of Peter M. A. Sherwood include University of Texas at Arlington & Oklahoma State University–Stillwater.
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Papers
Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities
TL;DR: A good overview of background models for x-ray photoelectron spectroscopy can be found in this paper, where the background is used to determine peak intensities of photoemission peaks of the elements detected.
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Gamma-Alumina (γ-Al2O3) by XPS
TL;DR: In this paper, the XPS spectra of gamma-alumina were collected with a VSW HA150 using monochromatic Al Kα x-radiation.
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Electrochemical and XPS study of the nickel-titanium electrode surface
TL;DR: A study undertaken by means of cyclic voltammetry, scanning electron microscopy, and X-ray photoelectron spectroscopy to understand the role of Ti and the respective surface oxides of Ni and Ti in the catalytic stability of the detector found that smoothness is consistent with the fact that the thickness of the surface "oxide" layer increases less rapidly, as Ni-Ti is repetitively CV cycled, compared to pure Ni.
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X-ray photoelectron spectroscopic studies of carbon fiber surfaces VIII—A comparison of type I and type II fibers and their interaction with thin resin films
TL;DR: In this article, a comparison of the differences in surface functionality and the possible interaction of treated fibers with epoxy resin is reported, and it is not possible to conclude whether chemical bonding is responsible for the increased interlaminar shear strength of composites produced from treated fibers.
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Quantitative use of the angular variation technique in studies of tin by X-ray photoelectron spectroscopy
TL;DR: In this article, the relative photoionisation crosssections of the tin 3 d and 4 d electrons are determined and combined with angular variation studies to estimate the photoionization cross-sections.
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