Formulas have been established which express the flux given by a spectrometer as a function of the effective resolving power and of the dimension of the dispersive system (area of the base of the prism, or area of the grating, or area of the plates of the etalon). It is thus possible to compare the luminosities of the three types of instruments with, in each case, equal resolving power and equal dimension. This comparison reveals a great superiority of the grating over the prism for all regions of wavelengths, and a great superiority of the etalon over the grating. In the case of the etalon, the overlapping may be overcome by the use of several etalons in series.

The luminosity of spectrometers with prisms, gratings, or Fabry-Perot etalons

To extend multiple beam interferometry in the VUV range below the limit of fused silica at 167 nm, magnesium fluoride etalon plates have been developed. The coatings are double layer films of Al-MgF2 as in silica interferometers. These etalon plates give improved performances for the transmission and the recorded finesse. Interferograms are presented for some UV transitions between 160 nm and 138 nm.

Improved MgF2 etalon plates for Fabry-Perot interferometry in the VUV from 170 to 138 nm

The microwave induced emission spectrum of gaseous HfS has been studied in the region 11 000-21 000 cm−1. Six band systems, not previously observed, have been photographically recorded in grating spectrographs and rotationally analysed. Five of the transitions terminate on a common lower state, the X1Σ state. The five upper states are in energy order the A1Σ, B1Π, D1Π, E1Π and F1Σ states. The sixth system, located between the B-X and D-X systems, is perturbed and is identified as the sulphide counterpart to the hafnium oxide system called C. Also, the three analysed lowest vibrational levels of the F1Σ state are perturbed. Accurate molecular constants of the five regular states, the X, A, B, D, and E states, have been determined using the direct approach method. Only the most abundant isotopomer Hf180S32 is treated.

On the emission spectrum of HfS

Recent developments in multiple beam interferometry in the ultraviolet region 1700-2500 Å

The absorption spectrum of SrD in the region 7200-8000 A has been photographed at high resolution. The rotational analysis of seven bands of the A2Π-X2Σ+ system has been carried out. Effective rotational constants of the A state are given, as well as equilibrium vibrational and rotational constants of both the A and X states.

https://iopscience.iop.org/article/10.1088/0031-8949/29/5/007/pdf

Rotational Analysis of the A-X Band System of SrD

An opto-electronical system for analysis of line profiles recorded on spectroscopic plates has been designed. The picture of the area of the plate to be studied is projected on three image sensing devices: a vidicon tube to produce a survey on a television screen, and two diode arrays to achieve the line profile scan. The electronic system is equipped with circuitry to produce an image of the line profiles together with electronic reference marks and sample-and-hold amplifiers for intensity measurements.

An Opto-Electronic System for Sensing Line Profiles of Spectroscopic Plates

The instrument functions of scanning Michelson and Fabry-Perot interferometers in the limiting case of coherence are investigated and characteristics such as the scanning aperture correction and resolving power are analysed. It is shown that there are no essential practical differences in these characteristics from those in the incoherent case.

https://iopscience.iop.org/article/10.1088/0031-8949/8/3/001/pdf

On Aperture Correction in Scanning Interferometry

An analysis system for measurement and data processing of spectra, recorded on spectrographic plates, is described. The system uses diode arrays for line profile scanning and a television camera for survey. The positions are measured using a Heidenhain equipment, and a micro-computer guides and controls the system. The computer is programmed to support the operator with utility routines for data collection and processing and for operator guidance.

A Measurement System for Spectrographic Plates

The instrument function of a composed system is discussed, with application to the scanning Fabry-Perot interferometer. The systematic deviation caused by the weight function of the scanning aperture is analysed and a comparison is made between the two cases when the instrument function of the etalon is described by the Airy formula and when the limited aperture is taken into account. The resolution power, the optimum size of the scanning aperture, the finesse and contrast of the instrument are analysed using the Airy formula.

On the scanning Fabry-Perot interferometer.

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An Opto-Electronic System for Sensing Line Profiles of Spectroscopic Plates

On Aperture Correction in Scanning Interferometry

A Measurement System for Spectrographic Plates

On the scanning Fabry-Perot interferometer.