This book is the first graduate-level textbook presenting a comprehensive treatment of Data Converters. It provides comprehensive definition of the parameters used to specify data converters, and covers all the architectures used in Nyquist-rate data converters. The book uses Simulink and Matlab extensively in examples and problem sets. This is a textbook that is also essential for engineering professionals as it was written in response to a shortage of organically organized material on the topic. The book assumes a solid background in analog and digital circuits as well as a working knowledge of simulation tools for circuit and behavioral analysis.

Data converters

A comprehensive numerical model for chalcogenide glasses is presented, coupling a physically based electrical model able to reproduce the threshold switching with a local nucleation and growth algorithm to account for the phase transition dynamics. The main ingredients of the chalcogenide physics are reviewed and analyzed through simplified analytical models, providing a deeper insight on the origin of the threshold switching mechanism in chalcogenide glasses. A semiconductorlike three-dimensional full-coupled numerical implementation of the proposed model is finally presented and its capabilities to quantitatively reproduce the key elements of the Ge2Sb2Te5 chalcogenide physics are demonstrated in the framework of phase change memory device simulations.

Threshold switching and phase transition numerical models for phase change memory simulations

Uncertainties have become a major concern in integrated circuit design. In order to avoid the huge number of repeated simulations in conventional Monte Carlo flows, this paper presents an intrusive spectral simulator for statistical circuit analysis. Our simulator employs the recently developed generalized polynomial chaos expansion to perform uncertainty quantification of nonlinear transistor circuits with both Gaussian and non-Gaussian random parameters. We modify the nonintrusive stochastic collocation (SC) method and develop an intrusive variant called stochastic testing (ST) method. Compared with the popular intrusive stochastic Galerkin (SG) method, the coupled deterministic equations resulting from our proposed ST method can be solved in a decoupled manner at each time point. At the same time, ST requires fewer samples and allows more flexible time step size controls than directly using a nonintrusive SC solver. These two properties make ST more efficient than SG and than existing SC methods, and more suitable for time-domain circuit simulation. Simulation results of several digital, analog and RF circuits are reported. Since our algorithm is based on generic mathematical models, the proposed ST algorithm can be applied to many other engineering problems.

/pdf/stochastic-testing-method-for-transistor-level-uncertainty-1wh760zexy.pdf

Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos

Version 4i, 23 October 2015 Two methodologies are presented for predicting the phase noise and jitter of a PLLbased frequency synthesizer using simulation that are both accurate and efficient. The methodologies begin by characterizing the noise behavior of the blocks that make up the PLL using transistor-level RF simulation. For each block, the phase noise or jitter is extracted and applied to a model for the entire PLL.

/pdf/predicting-the-phase-noise-and-jitter-of-pll-based-frequency-2ovz1e27ie.pdf

Predicting the Phase Noise and Jitter of PLL-Based Frequency Synthesizers

The electronics industry is increasingly focused on the consumer marketplace, which requires low-cost high-volume products to be developed very rapidly. This, combined with advances in deep submicrometer technology have resulted in the ability and the need to put entire systems on a single chip. As more of the system is included on a single chip, it is increasingly likely that the chip will contain both analog and digital sections. Developing these mixed-signal (MS) systems-on-chip presents enormous challenges both to the designers of the chips and to the developers of the computer-aided design (CAD) systems that are used during the design process. This paper presents many of the issues that act to complicate the development of large single-chip MS systems and how CAD systems are expected to develop to overcome these issues.

/pdf/design-of-mixed-signal-systems-on-a-chip-1ase6umq8j.pdf

Design of mixed-signal systems-on-a-chip

From the Publisher:
The Designer's Guide to SPICE and Spectrer is an in-depth guide to circuit simulators from a designer's perspective: the pitfalls of circuit simulation, such as convergence and accuracy problems, are explained in terms a circuit designer is comfortable with. The book gives designers insight into why these problems occur and how to avoid them. It also provides practical advice on how to make many difficult measurements with a circuit simulator, such as loop gain of an op-amp or distortion measurements of such clocked circuits as d-to-a converters and sample-and-hold circuits. Finally, suggestions are given about how to handle difficult classes of circuits, such as oscillators, charge-storage or very large circuits. After reading The Designer's Guide to SPICE and Spectrer, you will spend less time fighting your simulator and more time exploring, understanding and designing your circuits.

The designer's guide to SPICE and Spectre

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The designer's guide to SPICE and Spectre