Omkar Phadke
20 Papers
Omkar Phadke is an academic researcher. The author has contributed to research in topics: Computer science & Set (abstract data type). The author has co-authored 2 publications.
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Papers
Tunable Non-volatile Gate-to-Source/Drain Capacitance of FeFET for Capacitive Synapse
Tae-Hyeon Kim,Omkar Phadke,Yuan-Chun Luo,Halid Mulaosmanovic,Johannes Mueller,Stefan Duenkel,Sven Beyer,Asif Islam Khan,Suman Datta,Shimeng Yu +9 more
TL;DR: It is demonstrated by TCAD simulation that the physical origins of on-state and off-state capacitance are dominated by the inversion capacitance and the overlap capacitance, respectively, and design guidelines are presented to further increase the on/off ratio.
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BEOL Compatible Oxide Power Transistors for On- Chip Voltage Conversion in Heterogenous 3D (H3D) Integrated Circuits
Sunbin Deng,Jungyoun Kwak,Junmo Lee,Khandker Akif Aabrar,Tae-Hyeon Kim,Gi Hwan Choe,Sharadindu Gopal Kirtania,Chengyang Zhang,Wantong Li,Omkar Phadke,Shimeng Yu,Suman Datta +11 more
- 09 Dec 2023
TL;DR: High-voltage BEOL compatible oxide power transistors and superlattice capacitors for voltage conversion in H3D integrated circuits.
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Reliability Assesement of Ferroelectric nvCAP for Small-Signal Capacitive Read-Out
Omkar Phadke,Halid Mulaosmanovic,Stefan Dunkel,Sven Beyer,Shimeng Yu +4 more
- 14 Apr 2024
TL;DR: The reliability aspects of small-signal nvCAP mode in FeFET devices are evaluated. Endurance, retention, and MLC are assessed. The device exhibits up to 107 program-erase cycles and can be recovered by C-V sweep.
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Low-Frequency Noise Characteristics of Ferroelectric Field-Effect Transistors
Omkar Phadke,Khandker Akif Aabrar,Yuan-Chun Luo,Sharadindu Gopal Kirtania,Asif Islam Khan,Suman Datta,Shimeng Yu +6 more
- 01 Mar 2023
TL;DR: In this paper , low-frequency noise (LFN) characterization of ferroelectric field effect transistor (FeFET) was performed for ON and OFF memory state of the devices to study the effect of polarization on the noise performance.
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