La2Zr2O7 (LZO) formation of bulk powders and of films by Chemical Solution Deposition (CSD) process have been studied using propionates. The treatment involved a one step cycle in the reducing forming gas (Ar-5%H2) to be compatible with Ni-5at%W RABITS. Large amount of residual carbon was found in LZO powders formed in these conditions (10 wt %). The volume fraction of the cube texture in LZO films on Ni-5at%w RABITS was found to be a function of the speed of the gas flown above sample. This phenomenon is discussed in considering the C deposited from the carbon-containing gases emitted during the pyrolysis of the precursor. Using proper conditions (950 °C and the speed of gas of 6.8×10-2 m/s), LZO films with good surface crystallinity could be obtained on Ni-5at%W RABITS as demonstrated by X-ray diffraction, electron backscattered diffraction and RHEED. The existence of residual carbon in oxide films is a common question to films deposited by CSD processes under reducing condition.

https://hal.archives-ouvertes.fr/hal-00466307/document

Deposition of La2Zr2O7 film by chemical solution deposition

A study of the parameters influencing the microstructure of thick La2Zr2O7 films

In the present work, the single buffer layers of La2Zr2O7 (LZO) with different thicknesses were prepared using pulsed laser deposition (PLD) on highly textured Ni?5?at.%W tapes for YBa2Cu3O7??-coated conductors. The highly textured LZO layers are obtained on the metallic substrates, making the subsequent epitaxial growth of superconducting YBa2Cu3O7?? layers feasible. The superconducting transition temperature increases as the LZO thickness increases up to 240?nm, achieving a value of Tc of more than 92?K with a narrow transition width less than 1?K. Inductive measurement reveals that the critical current density (Jc) reaches 0.77?MA?cm?2 at 77?K in self-field, showing that the single buffer of LZO is comparable to standard buffer architectures such as CeO2/YSZ/Y2O3 or CeO2/LZO. This implies that the LZO as a single buffer layer is promising for the simplification of the preparation process, leading to cost-effective coated conductors.

http://iopscience.iop.org/article/10.1088/0953-2048/22/9/095005/pdf

Thickness effect of La2Zr2O7 single buffers on metallic substrates using pulsed laser deposition for YBa2Cu3O7−δ-coated conductors

Effect of the annealing process on the microstructure of La2Zr2O7 thin layers epitaxially grown on LaAlO3 by metalorganic decomposition

The complex [Y(Prop)3(H2O)]∞ (I) was prepared by treating yttrium carbonate, acetate, or acetylacetonate hydrates with propionic acid and characterized by the data of elemental analysis, IR spectroscopy, X-ray diffraction, and thermal analysis in air. Complex I has a polymeric layered structure with clear-cut structure-forming dimeric groups bridged by bidentate ligands. Only van der Waals interactions occur between the adjacent polymeric layers. In air, yttrium propionate monohydrate I is completely converted to the oxide at 600°C.

Yttrium tris-propionate monohydrate: Synthesis, crystal structure, and thermal stability

Optimisation of single La2Zr2O7 buffer layers for YBCO coated conductors prepared by chemical solution deposition

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Optimisation of single La2Zr2O7 buffer layers for YBCO coated conductors prepared by chemical solution deposition