Monique Mcintosh
Applied Materials
7 Papers
48 Citations
Monique Mcintosh is an academic researcher from Applied Materials. The author has contributed to research in topics: Scrubber & Effluent. The author has an hindex of 4, co-authored 7 publications.
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Papers
Patent
Methods and apparatus for process abatement
Sebastien Raoux,Brian Kingston,Mark W. Curry,Daniel O. Clark,Robbert M. Vermeulen,Belynda Flippo,Mark Holst,Steve Tsu,Kevin Lin,Monique Mcintosh +9 more
- 13 Jun 2006
TL;DR: In this article, a first abatement apparatus for semiconductor device manufacturing is described, which includes an oxidation unit adapted to receive an effluent stream from a semiconductor manufacturing chamber.
19
Patent
Methods and apparatus for pfc abatement using a cdo chamber
Sebastien Raoux,Kuo-Chen Lin,Robbert M. Vermeulen,Daniel O. Clark,Stephen Tsu,Mehran Moalem,Allen Fox,Monique Mcintosh,Joshua Putz,Eric Rieske,Poh Soh Lee +10 more
- 09 Feb 2007
TL;DR: In this paper, a method for abating perfluorocarbons (PFCs) in a gaseous waste abatement system having a pre-installed controlled decomposition oxidation (CDO) thermal reaction chamber is provided.
16
Patent
Plasma abatement of compounds containing heavy atoms
Michael S. Cox,Monique Mcintosh,Colin John Dickinson,Paul Fisher,Yutaka Tanaka,Zheng Yuan +5 more
- 04 Mar 2015
TL;DR: A plasma abatement process for abating effluent containing compounds from a processing chamber is described in this article, which takes gaseous foreline effluent from a deposition chamber, and reacts the effluent within a plasma chamber placed in the foreline path.
9
Opportunities and perspectives for green chemistry in semiconductor technologies
TL;DR: In this paper, a renewed collaborative focus on green chemistry throughout the ecosystem of the semiconductor industry, particularly in the pre-competitive stage, will be fundamental to seeing those solutions through to implementation.
9
Patent
Vacuum foreline reagent addition for fluorine abatement
Colin John Dickinson,Dustin W. Ho,Monique Mcintosh +2 more
- 28 Aug 2015
TL;DR: In this paper, an abatement system for semiconductor processes is described, which includes a foreline having a first end configured to couple to an exhaust port of a vacuum processing chamber, and an injection port is formed in the foreline.
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