Mildred S. Dresselhaus
Massachusetts Institute of Technology
765 Papers
7.6K Citations
Mildred S. Dresselhaus is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Carbon nanotube & Raman spectroscopy. The author has an hindex of 136, co-authored 762 publications. Previous affiliations of Mildred S. Dresselhaus include University of California, Los Angeles & Universidade Federal de Minas Gerais.
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Papers
4-Point Resistance Measurements of Individual Bi Nanowires
Stephen B. Cronin,Yu-Ming Lin,Pratibha L. Gai,Oded Rabin,Marcie R. Black,Gene Dresselhaus,Mildred S. Dresselhaus +6 more
TL;DR: In this article, single crystal bismuth nanowires with diameters ranging from 10 to 200nm and lengths of approx. 50 microns have been synthesized by pressure injecting molten bistuth into anodic alumina templates, and a scheme for measuring the resistance of a single Bi nanowire using a 4-point measurement technique.
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Characterizing the chirality distribution of single‐walled carbon nanotube materials with tunable Raman spectroscopy
TL;DR: In this paper, the chirality distribution of a synthesized single-walled carbon nanotube (SWNT) material is characterized using Resonant Raman spectroscopy with a tunable excitation source.
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•Journal Article
Enhancement of Thermoelectric Figure-of-Merit by a Nanostructure Approach
Magnetic Intercalation Compounds of Graphite
Gene Dresselhaus,J. T. Nicholls,Mildred S. Dresselhaus +2 more
- 01 Jan 1992
TL;DR: In this article, the structure and magnetic properties of magnetic acceptor and donor graphite intercalation compounds (GICs) are reviewed and compared with recent evidence for 2D magnetism in acceptor GICs.
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Non-stoichiometry in SnTe thin films and temperature instabilities of thermoelectric properties
E.I. Rogacheva,O. N. Nashchekina,T. V. Tavrina,Ye. O. Vekhov,A. Yu. Sipatov,Mildred S. Dresselhaus +5 more
TL;DR: In this paper, the temperature dependences of the Seebeck coefficient and the electrical conductivity for (0, 0, 1)KCl/SnTe thin films with thickness d = 20-600nm were obtained in the range of 80-300 K.
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