Michael Salamon
Fraunhofer Society
49 Papers
87 Citations
Michael Salamon is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Computer science & Detector. The author has an hindex of 7, co-authored 39 publications.
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Papers
Growth of SiC bulk crystals for application in power electronic devices – process design, 2D and 3D X‐ray in situ visualization and advanced doping
TL;DR: In this article, a review of the physical vapor transport growth method as applied today is presented, focusing on currently less advanced in situ growth monitoring tools based on 2D and 3D X-ray imaging that could be a tool for production monitoring.
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X-ray microtomography for materials characterization
Randolf Hanke,Theobald Fuchs,Michael Salamon,Simon Zabler +3 more
- 01 Jan 2016
TL;DR: The main goal in micro-CT is to further increase the spatial resolution, while simultaneously reducing scan times and improving the contrast-to-noise ratio as discussed by the authors, which will be achieved by advanced X-ray sources with smaller focal spot sizes, by advanced detector systems with smaller pixel sizes and modern reconstruction algorithms.
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Comparison of different methods for determining the size of a focal spot of microfocus X-ray tubes
TL;DR: For the evaluation and extension of the present methods to smaller focal spot sizes, different procedures in comparison with the existing EN 12543-5 were analyzed and applied, and the results are presented.
30
Realization of a computed tomography setup to achieve resolutions below 1 μm
TL;DR: In this paper, an experimental setup of a computed tomography system with sub-micrometer resolution is presented and the requirements on and characteristics of the components and their influence on the measurements are discussed.
27
Characterization and comparison of direct and indirect converting X-ray detectors for non-destructive testing (NDT) in low-energy and high-resolution applications
TL;DR: In this paper, the characterization and application tests were performed on the direct converting X-ray detector Ajat DIC 100TL (Oy AJAT Ltd.) which is based on CdTe with a CMOS readout and the indirect converting Xray detector C9311DK (Hamamatsu) with a CsI readout.
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