Matthias Ebert
Fraunhofer Society
50 Papers
357 Citations
Matthias Ebert is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Reliability (statistics) & Photovoltaic system. The author has an hindex of 15, co-authored 50 publications.
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Papers
Systematic investigation of cracks in encapsulated solar cells after mechanical loading
TL;DR: In this paper, a novel approach was developed that systematically analyzes the influence of the load direction on the crack directions, and the cell cracks were statistically evaluated and the fracture stress can be compared directly for different crack orientations or different cell types.
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Investigations of the influence of dicing techniques on the strength properties of thin silicon
TL;DR: The influence of three different dicing technologies on the mechanical strength of thin silicon samples was investigated by 3-point bending tests to allow a more comprehensive understanding of the influence of the process on strength properties independently of geometric factors.
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Micromachined Mid-Infrared Emitter for Fast Transient Temperature Operation for Optical Gas Sensing Systems
J. Hildenbrand,Jan G. Korvink,Jürgen Wöllenstein,Carolin Peter,A. Kürzinger,Falk Naumann,Matthias Ebert,F. Lamprecht +7 more
TL;DR: In this paper, a micromachined thermal emitter for fast transient temperature operation with a novel hot-plate concept is presented, which is based on a nonaxis-symmetric design with excellent mechanical properties during temperature modulation combined with high thermal decoupling.
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Investigations on crack development and crack growth in embedded solar cells
Martin Sander,Sascha Dietrich,Matthias Pander,Stefan Schweizer,Matthias Ebert,Jörg Bagdahn +5 more
- 13 Sep 2011
TL;DR: In this paper, the authors present two experiments for systematic investigation of crack initiation and crack growth under thermal and mechanical loading using electroluminescence using PV modules and laminated test specimens on smaller scales.
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Interlaboratory study to determine repeatability of the damp-heat test method for potential-induced degradation and polarization in crystalline silicon photovoltaic modules
Peter Hacke,Kent Terwilliger,Stephen Glick,GovindaSamy TamizhMani,Sai Tatapudi,Cameron Stark,S. Koch,Thomas Weber,J. Berghold,S. Hoffmann,Michael Koehl,Sascha Dietrich,Matthias Ebert,Gerhard Mathiak +13 more
TL;DR: In this article, three crystalline silicon module types were distributed in five replicas each to five laboratories to test reproducibility of a technical specification under development for potential-induced degradation (PID) and polarization.
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