Marcus Klein
Fraunhofer Society
7 Papers
46 Citations
Marcus Klein is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Eddy current & Eddy-current testing. The author has an hindex of 3, co-authored 7 publications.
Chat about Author
Papers
Review on quality assurance along the CFRP value chain – Non-destructive testing of fabrics, preforms and CFRP by HF radio wave techniques
Henning Heuer,Henning Heuer,Martin Schulze,Matthias Pooch,S. Gäbler,S. Gäbler,Andreas Nocke,Georg Bardl,Ch. Cherif,Marcus Klein,Richard Kupke,R. Vetter,Florian Lenz,Mathias Kliem,C. Bülow,J. Goyvaerts,T. Mayer,S. Petrenz +17 more
TL;DR: In this article, the effect of dielectric properties of CFRP carbon rovings on eddy current measurement signal has been investigated and an explanation for that effect is seen in the measurement frequency and the capacitive structure of the carbon RoVings.
Automated detection of yarn orientation in 3D-draped carbon fiber fabrics and preforms from eddy current data
Georg Bardl,Andreas Nocke,Chokri Cherif,Matthias Pooch,Martin Schulze,Henning Heuer,Henning Heuer,Marko Schiller,Richard Kupke,Marcus Klein +9 more
TL;DR: In this article, a 2D Fast Fourier Transform is applied to local segments of the eddy current image to determine the local yarn orientation, and reference yarn paths are reconstructed from the determined yarn angles.
64
Analysis of the 3D draping behavior of carbon fiber non-crimp fabrics with eddy current technique
Georg Bardl,Andreas Nocke,Matthias Hübner,Thomas Gereke,Matthias Pooch,Martin Schulze,Henning Heuer,Henning Heuer,Marko Schiller,Richard Kupke,Marcus Klein,Chokri Cherif +11 more
TL;DR: In this paper, the draping of biaxial non-crimp fabrics to a hemispherical shape is investigated with an eddy current imaging technique, where the yarn directions are extracted by image analysis and the paths of individual yarns are reconstructed for both the upper and the lower layer.
40
Sub Surface Material Characterization using High Frequency Eddy Current Spectroscopy
TL;DR: In this article, the authors present a new concept based on high frequency eddy current spectroscopy that allows reliable and robust thickness measurements of thin conducting films on silicon or insulation substrates with thickness resolution of about 2.5 nm.
3
Eddy current imaging for electrical characterization of silicon solar cells and TCO layers
TL;DR: In this article, the authors summarize the state of the art applications focusing on PV industry and extend the analysis implementing achievements by applying spatially resolved Eddy current testing, which enables the acquirement of information of different depth level in conductive thin-film structures by realizing proper standard penetration depth.
3