Publisher Summary This chapter discusses that in the absence of lenses, illuminating devices and automatic controls, a field-emission microscope, is less of an apparatus and more of a direct aid to the eye and brain. Perhaps for this reason, field emission microscopy made possible a direct observation of adsorption, desorption, and diffusion phenomena on atomically clean, single crystal metal surfaces. The foundation for field-electron emission microscopy was established in with the discovery that an electron current could be measured between two room-temperature electrodes in high vacuum whenever critical electric field strength was established between them. It was found that the logarithm of the electron current, striking the anode, depended linearly on the reciprocal of the cathode potential. A sharply pointed cathode produced the same current as a dull tip, but at a lower voltage. This suggested that the electron emission process depended upon the electric field strength generated at the tip surface. The chapter also discusses the applications of field-electron emission microscopy that includes surface diffusion, sputtering, nucleation, and electron sources, electrical breakdown in high vacuum, molecular imaging, and single-atom imaging.

7. High-Field Techniques

The atom probe field ion microscope (AP-FIM) is a combination of a field ion microscope and a time-of-flight mass spectrometer with a single ion detection sensivity. With the field ion microscope topology of a surface, surface reactions and surface modifications can be studied in atomic detail. By time-of-flight measurements surface layers and interface layers can be chemically analyzed atom by atom and atomic layer by atomic layer. Compositional variations according to surface or interface segregation, precipitations, or surface changes in corrosion or in electrochemical layer formation etc. can be studied quantitatively on a subnanometer scale. Some of our studies on related problems will be decribed briefly.

Atom-probe field ion microscopy

A number of features characteristic of different thin-film analytical methods are reviewed and evaluated. The principles, approach for quantification and prominent problems of the most commonly used methods (ESCA, AES, SIMS, LEIS, RBS and NRA) are discussed. Evaluation of the special advantages and disadvantages of the different methods points out the need for a synergetic multi-method approach in thin-film analysis.

http://iopscience.iop.org/article/10.1088/0034-4885/47/3/001/pdf

A comparative study of methods for thin-film and surface analysis

In the past, evidence has been accumulated which indicates that the surface composition of an alloy is different from its volume composition. A number of properties of a metal or an alloy depends exclusively on the surface composition. In particular, the catalytic activity of alloys is of great technological importance1, 2.

Surface Composition Profiles of Alloys, Determined with Single-Layer Resolution

Atom-probe studies on surface segregation in the binary alloy, tungsten-molybdenum

Handle everyday research tasks with reliable, citation-backed results

Your personal Research Agent to handle research tasks with citation-backed results

Popular Tasks used by Researchers

How can I help with your research?

Meet SciSpace

Get more enhanced response by uploading the PDFs you want me to reference.

No relevant PDFs in your library

SciSpace is the AI research assistant for academics. Run systematic literature reviews on 280M+ papers, and write papers with cited sources. Trusted by 1M+ students, PhDs & researchers.

SciSpace | AI for Research

Analyze PDFs

Code & Manuscripts

Funding & Grants

Literature & Patents

Medical & Clinical Data

Systematic Review

Visualize & Present

Web & Data

Build a Google Scholar-like website for your research.

Build a website

Create charts and images for your research

Create a Chart

Write a paper for submission to a journal

Draft a manuscript

Patent Search

Design eye-catching scientific posters in minutes.

Scientific Poster Generation

Systematic Literature Review

One task is running at the moment. Your messages will be shown right after.

Drag and drop or click here to browse

Loved by <highlight>1 million+</highlight> researchers

Extract a list of specific topics and their sources from unstructured text

Topics

Compare and analyze relevant papers that matches with your search

Papers

Get insights from PDFs and bookmarked papers from your library

My library

Recent searches

Try searching for:

Catch AI-generated content in scholarly and non-scholarly content

{ai} Detector

Ai Writer

Get PDF Summaries, highlighted text explanations 

Chat with PDF

Effortlessly create in-text citations and bibliographies in APA and 2,500 other formats

Citation generator

Get explanations, summaries, and answers on academic papers

Ease up your research workflow with {scispace}'s cohort of exciting AI tools

Elevate your academic writing skills and convey your ideas the way you want

Paraphraser

Explore our range of reading and writing tools

Your file is being prepared and should be ready in a few minutes. If it's a large file, it might take a bit longer. You can close this window, and we'll email you the file when it's done.

You have reached a maximum limit of <strong>{limit}</strong> columns in the table. Remove at least <strong>1</strong> column to add or create another one.

Manfred Leisch

Author Tools

Chat about Author

Papers

Surface Composition Profiles of Alloys, Determined with Single-Layer Resolution

Atom-probe studies on surface segregation in the binary alloy, tungsten-molybdenum