Makena Lu
1 Papers
Makena Lu is an academic researcher. The author has contributed to research in topics: Computer science. The author has co-authored 1 publications.
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Papers
Image Confusion Applied to Industrial Defect Detection System
Hao Yuan Chen,Yu-Chen Yeh,Makena Lu,Chia-Yu Lin +3 more
- 06 Jul 2022
TL;DR: A system that confuses input images and uses them to train the model, which has a high accuracy in defect image classification and can achieve product information protection and accurate defect detection.