The embodiment of the invention discloses a semiconductor laser testing system and method, used for a ring semiconductor laser. The semiconductor laser testing system comprises a ring semiconductor laser light source having at least two sets of light emitting units, a first light guide part, a rotary mechanism and a testing component. On the basis of the semiconductor laser testing system and method provided in the invention, in the normal working state of the ring semiconductor laser light source, laser emitted by various light emitting units can be tested one by one; furthermore, laser, which does not need to be tested, also can be exported; and thus, the testing precision and accuracy can be improved.

Semiconductor laser testing system and method

The invention discloses an optical property detection system for laser bar and single-tube light emission of the laser bar. The optical property detection system comprises a pickup station, an inspection station, a carrying station and a control assembly, the control assembly is electrically connected with the pickup station, the inspection station and the carrying station, and the control assembly is used for controlling the stations to act in a mutually coordinated manner, and controlling the inspection station to acquire the surface image of the laser bar, and judging and recording the detection data. The conveying station is used for conveying the laser bars between the pickup station and the inspection station in a reciprocating mode, pickup station comprises a moving platform, and atray used for containing the laser bars is arranged on the moving platform. High-resolution machine vision detection can be carried out on pollutants, particles, cleavage textures and other defects existing on the surface of the laser bar, and high detection efficiency and precision are achieved.

Optical property detection system for laser bar and single-tube light emission of laser bar

The embodiment of the invention provides scanning-type safety test equipment and method for estimating laser radiation of a protection screen. The scanning-type safety test equipment comprises a waveguide, a two-dimensional moving platform and a computer, wherein the waveguide is arranged on the two-dimensional moving platform, a protection cap is designed at a front end of the waveguide and is used for preventing interference of stray light, and the computer is used for controlling the two-dimensional moving platform to drive the front end of the waveguide to do two-dimensional moving so as to scan a to-be-tested protection screen point by point and acquire laser, passing through the protection screen, of each test point, acquiring energy or power of laser acquired by each test point to obtain maximum radiation point of the protection screen and comparing a radiation value of the maximum radiation point with the maximum allowable radiation MPE to judge whether the radiation value of the maximum radiation point is safe to a human eye. The maximum radiation of the laser is tested by a mode of driving the waveguide to scan the screen point by point by the two-dimensional driving platform, the test efficiency is higher than that of a handheld power/energy detector, the test data is accurate, and the maximum radiation region can be accurately positioned.

Scanning-type safety test equipment and method for estimating laser radiation of protection screen

The invention relates to a single bar power and stability measuring device in laser diode lamination array and the method, comprising a laser diode lamination array, a light guiding pipe, a horizontally moving station, a light separation waveguide reflector, an integrating sphere, a detection window, a power meter, and a parasitic light collector. The lasers emitted by the different single bars in the laser diode lamination array are dispersed and laminated quickly in the rapid shaft direction. The light guiding pipe is arranged right in front of the to-be-detected single bars. The lasers emitted from the to-be-detected single bars can be completely coupled into the light guiding pipe, and the lasers emitted from the bars of other diodes enter the light separation waveguide reflector, and at the inclined edges of the light separation waveguide reflector, reflection occurs, and the light enters the parasitic light collector, rather than the light guiding pipe. Through the outlet of the light guiding pipe, the light enters the integrating sphere, and after the light is uniformed in the integrating sphere, the power meter tests the power of the lasers of the single bar. Through the horizontally moving platform to move the laser diode lamination array, the single bars in the lamination array are aligned with the light guiding pipe so that the power and the power stability performance of the single bars in the lamination array can be tested.

Single bar power and stability measuring device in laser diode lamination array and the method

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Single bar power and stability measuring device in laser diode lamination array and the method