OF THE DISSERTATION Successful Beam-beam Tuneshift Compensation

http://inspirehep.net/record/1395359/files/fermilab-thesis-2005-105.pdf

Successful Beam-Beam Tuneshift Compensation

Initially the Tevatron Electron Lenses (TELs) were intended for compensation of the beam-beam effect on the antiproton beam [1]. Owing to recent increase in the number of antiprotons and reduction in their emittance, it is the proton beam now that suffers most from the beam- beam effect [2]. We present results of beam studies, compare them with the results of computer simulations using LIFETRAC code and discuss possibilities of further improvements of the Beam-Beam Compensation efficiency in the Tevatron.

/pdf/experimental-and-simulation-studies-of-beam-beam-1et9mvh791.pdf

Experimental and simulation studies of beam-beam compensation with tevatron electron lenses

The solid-state Marx generator modulates the anode of the electron gun to produce the electron beam pulses in the second Tevatron Electron Lens (TEL2). It is capable of driving the 60 pF terminal with 600 ns pulses of up to 6 kV with a p.r.r. of 50 kHz. The rise and fall times are 150 ns. Stangenes industries developed the unit and is working on a second version which will go to higher voltage and have the ability to vary its output in 396 ns intervals over a 5 mus pulse.

/pdf/a-solid-state-marx-generator-for-tel2-1qljvvyht3.pdf

A solid state Marx generator for TEL2

To compensate for beam-beam interaction in tevatron, an "electron lens" is considered to be an effective instrument. When a bunch of electrons with energy in the range (10-16) kV is overlapping with a bunch of antiprotons, the resulting focusing force for antiprotons can be adjusted by changing the electron beam current and by profiling its radial distribution. There exist several scenarios of how the system must function. According to one of them, an electron gun that supplies electrons must be fed by voltage pulses that follow with the frequency of antiproton bunches circulating in the tevatron, which is about 2.5 MHz. To provide focusing tailored for each individual antiproton bunch, a modulator of the gun (pulser) must allow pulse-to-pulse voltage change.

http://ieeexplore.ieee.org/iel5/9797/30905/01433601.pdf

Pulser for the tevatron electron lens gun

/pdf/electron-gun-for-rhic-ebis-3wc7l2dpwh.pdf

Electron Gun for RHIC EBIS

In the framework of Fermilab's Beam-Beam Compensation (BBC) project, the 2nd Tevatron electron lens (TEL2) was installed in the Tevatron during Spring 2006 shutdown. It was successfully commissioned and a series of beam studies has been carried out in single bunch and all-bunch modes. The paper describes TEL2 commissioning and beam studies results.

/pdf/commissioning-of-the-second-tevatron-electron-lens-and-beam-4s7yi9npy6.pdf

Commissioning of the second Tevatron Electron Lens and beam study results

This paper will describe the main upgrades of the Tevatron Electron Lens (TEL) during the year 2003. The bending angle of the electron beam entrance and exit to the main solenoid will be decreased from 90 degrees to 53 degrees and three more solenoids will be added to each of the two bends, which will allow us to control the electron beam size more freely. A new gun will also be installed which will give us a Gaussian transverse beam distribution in addition to the flat beam with much smoother edge to minimize the nonlinear effect of the beam-beam force. In addition, a new BPM system will be installed to let us have more precise beam position measurements for proton, antiproton and electron beams. A knife-edge beam profile measurement system will replace the space-consuming scanning wires. We expect that these upgrades will improve the ability to increase the lifetime of the (anti)proton beam during beam-beam compensation operation.

Upgrades of the Tevatron electron lens

The first Tevatron Electron Lens (TEL) has been installed and commissioned successfully as part of the Beam‐Beam Compensation project at Fermilab[1]. Currently it is operated routinely for DC beam cleaning during Tevatron luminosity stores and for advanced beam‐beam studies. This paper reviews the electron and proton (antiproton) beam diagnostics, which allow us to measure beam intensity, waveform, losses, position, timing and profile. In addition, other proton (antiproton) diagnostics, available from the Tevatron control system, which are used for tuning beam parameters in the TEL (tune‐shift, orbit, emittances, lifetime measurements, etc) are also described. We also present the results of measurements of the beam parameters and discussions for future upgrades.

Operation of the Beam Diagnostics System for Tevatron Electron Lens

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Commissioning of the second Tevatron Electron Lens and beam study results

Upgrades of the Tevatron electron lens

Operation of the Beam Diagnostics System for Tevatron Electron Lens