The microstructures present in a thin film of La0.7Sr0.3MnO3, grown by computer-controlled laser molecular beam epitaxy on a SrTiO3 (001) substrate, were characterized by means of cross-section and plan-view transmission electron microscopy. Four kinds of rhombohedral-oriented domains and two types of domain boundaries were identified in the film. The crystallographic relationships between each domain and the substrate were established on the basis of a hexagonal unit cell using Miller-Bravais indices. A mechanism for the formation of the oriented domains is proposed from the viewpoint of the evolution of strain relaxation during film preparation.

Crystallographic study of the rhombohedral-oriented domains in a La0.7Sr0.3MnO3 film

The distortions of MnO6 octahedra in layered manganites La0.4Ca2.6Mn2O7, which play a key role in the structure transformations and physical properties, were investigated by using a 200 kV high-resolution transmission electron microscope. Tetragonal, orthorhombic (superstructure), and monoclinic phases were found to coexist in the form of microdomains. In particular, the distortions of MnO6 octahedra in the orthorhombic and monoclinic phases were revealed directly at atomic resolution by means of image deconvolution. The differences of the Mn atomic columns in position, size, and contrast among the tetragonal, orthorhombic, and monoclinic phases, caused by the rotation or tilt of the MnO6 octahedra, were directly obtained from the corresponding structure projection maps.

Direct imaging of the distortions of MnO6 octahedra in La0.4Ca2.6Mn2O7

Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film

The appearance of forbidden reflections in the electron diffraction patterns of L0.7Ca0.3MnO3 was studied, which violates the Pnma symmetry reported so far in X-ray and neutron diffractometry studies. The forbidden reflections originate through the multiple diffraction process of a crystal slightly inclined from its zone axis. Under this diffraction condition, the corresponding superlattice contrasts in high resolution transmission electron microscopy images were reproduced in image simulations made without the assumption of symmetry reduction in the crystal.

Electron Microscopy of La0.7Ca0.3MnO3

The microstructures of La0.7Ca0.3MnO3 (LCMO) and La1.0Nd0.2Sr1.8Mn2O7 (LNSMO) bulk materials, LCMO thin films prepared by different methods, and LCMO/Gd0.7Ca0.3MnO3 (GCMO) multilayers have been studied by high-resolution electron microscopy. Twins and microdomains in the LCMO bulk materials as well as the intergrowth structure, ( 10 1) crystal shear Structure, and a complex defect structure in LNSMO bulk materials were observed. The displacement of oxygen ion in LCMO films grown on LaAlO3 (LAO) by pulsed laser deposition (PLD) method induces the structure transformation from orthorhombic to monoclinic. The evolution of strain in LCMO films prepared by reactive sputtering (RS) method on both LAO and SrTiO3 substrates was studied as a function of film thickness. The distribution and size of oriented domains observed in LCMO films prepared by RS were different from those prepared by PLD. The inner strains exist in LCMO and GCMO layers, which might result in lower T, and larger resistivity maximum in LCMO/GCMO multilayers.

Characterization of the microstructure in CMR materials by HREM

Characterization of the microstructure in CMR materials by HREM (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)

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Characterization of the microstructure in CMR materials by HREM

Characterization of the microstructure in CMR materials by HREM (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)