M. E. Suddards
University of Nottingham
5 Papers
29 Citations
M. E. Suddards is an academic researcher from University of Nottingham. The author has contributed to research in topics: Quantum Hall effect & Scanning capacitance microscopy. The author has an hindex of 4, co-authored 5 publications.
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Papers
Real-space imaging of quantum Hall effect edge strips
TL;DR: In this article, the authors used dynamic scanning capacitance microscopy (DSCM) to image compressible and incompressible strips at the edge of a Hall bar in a two-dimensional electron gas (2DEG) in the quantum Hall effect (QHE) regime.
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Lung function measurement with multiple-breath-helium washout system
TL;DR: Results from 14 volunteers have shown that mild asthmatics have higher ventilation inhomogeneity in either conducting or acinar airways (or both), and a feature has been found in washout curve of single breaths from 4 tobacco smokers with different length of smoking history which may indicate the early stage of respiratory ventilation inhmogeneity in acinarAirways.
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Scanning capacitance imaging of compressible and incompressible quantum Hall effect edge strips
TL;DR: In this article, the authors used dynamic scanning capacitance microscopy to image compressible and incompressible strips at the edge of a Hall bar in a two-dimensional electron gas (2DEG) in the quantum Hall effect (QHE) regime.
Low-temperature and high magnetic field dynamic scanning capacitance microscope
TL;DR: In this article, the authors demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures, and high magnetic fields using a noncontact atomic force microscope (AFM) with a quartz tuning fork sensor for the nonoptical excitation and readout.
Scanning capacitance imaging of compressible quantum Hall effect stripes formed at the sample edge and at a potential fluctuation
TL;DR: In this paper, the authors investigated the local conductivity of a two-dimensional electron gas (2DEG) in the regime of the quantum Hall effect with a scanning capacitance microscope.