M. Draxler
University of Warwick
36 Papers
279 Citations
M. Draxler is an academic researcher from University of Warwick. The author has contributed to research in topics: Ion & Low-energy ion scattering. The author has an hindex of 12, co-authored 36 publications. Previous affiliations of M. Draxler include Johannes Kepler University of Linz.
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Papers
Surface composition analysis by low-energy ion scattering
TL;DR: In this paper, a review of surface composition analysis by low-energy ion scattering (LEIS) is presented, where the authors summarize the present understanding of the factors that determine the ion fraction of the scattered particles in LEIS, i.e. charge exchange processes.
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ACOLISSA: a powerful set-up for ion beam analysis of surfaces and multilayer structures
M. Draxler,S.N. Markin,S.N. Ermolov,K. Schmid,C. Hesch,A. Poschacher,R. Gruber,M. Bergsmann,Peter Bauer +8 more
TL;DR: The experimental set-up for analysis of the charge of light ions scattered from surface atoms (ACOLISSA) is described in this paper, which is used for determination of flight times of low-energy ions.
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Growth of thin platinum films on Cu(1 0 0): CAICISS, XPS and LEED studies
TL;DR: In this article, the growth mode of platinum films on the Cu(1 − 0 − 0) surface up to a coverage of 2.75 ML has been studied using co-axial impact collision ion scattering spectroscopy (CAICISS), X-ray photoelectron spectrography and low energy electron diffraction.
33
Strength of the interatomic potential derived from angular scans in LEIS
TL;DR: In this paper, the influence of the used evaluation procedure on the deduced scattering potential was investigated and it was found that the use of a single screening correction factor is applicable in a wide range of impact parameters.
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Comprehensive study of the surface peak in charge-integrated low-energy ion scattering spectra
TL;DR: In this article, the surface peak of low-energy ion scattering is observed at low energies, which fades away at higher energies, and the appearance of a more or less pronounced surface peak is due to the relative contributions of single scattering and multiple scattering and thus depends on the projectile energy and mass.
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