Lutz Steinle
University of Tübingen
7 Papers
74 Citations
Lutz Steinle is an academic researcher from University of Tübingen. The author has contributed to research in topics: Thin layers & Layer (electronics). The author has an hindex of 3, co-authored 6 publications.
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Papers
Potential of label-free detection in high-content-screening applications.
Guenther Proll,Lutz Steinle,Florian Pröll,Michael Kumpf,Bernd Moehrle,Martin Mehlmann,Guenter Gauglitz +6 more
TL;DR: This review discusses the potential of a label-free optical biosensor based on reflectometric interference spectroscopy (RIfS) as a bridging technology for different HCS approaches.
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Reflectometric Interference Spectroscopy
TL;DR: Elaborate details on instrumental realization and surface chemistry are discussed for optimum application of reflectometric interference spectroscopy (RIfS).
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Adaptive compensation of the transmission errors in rack-and-pinion drives
Alexander Verl,Lutz Steinle +1 more
TL;DR: In this paper , the authors proposed an approach to minimize the individual errors of a drive by adaptive compensation in the control utilizing machine learning algorithms, where both kinematic deviations and load-dependent deformation of the gearing components are considered.
4
Amorphous silicon based p–i–i–n photodetector detects 12 nm thin protein layers
TL;DR: In this paper, the first steps of developing integrated thin film detectors for a label-free point-of-care testing (POCT) in a university hospital were reported, where the dynamic adjustment of the spectral response of a p-I-i-n photodiode by a variable read-out voltage, and the monolithic integration of the a-Si based detector into the reflectometric interference spectroscopy (RIfS) setup were presented.
4
Patent
Analysis of molecular interactions on and/or in thin layers
Guenter Gauglitz,Guenther Proll,Florian Proell,Lutz Steinle,Markus Dr. Schubert +4 more
- 09 Aug 2008
TL;DR: In this paper, a thin layer disposed on a carrier is illuminated with electromagnetic radiation from at least one radiation source and a reflected radiation part on boundary surfaces of the thin layer is detected by means of an optoelectronic converter that converts the detected radiation into a frequency and intensity-dependant photocurrent.
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