Extraction of tellurium and high purity bismuth from processing residue of zinc anode slime by sulfation roasting-leaching-electrodeposition process

ABSTRACT Thermoelectric (TE) technology enables direct conversion between thermal and electrical energies and thus has been regarded as an alternative for energy harvesting and refrigeration. Bismuth telluride (Bi2Te3) is the most widely used TE material at room temperature due to its high figure of merit (∼1). Since the first publication on the electrodeposition of Bi2Te3 films in 1994, a large number of publications has emerged in the last two decades, owing to its advantages such as simple and safe preparation, high deposition rate, convenient micromachining, good compatibility to semiconductor microfabrication techniques and so on. This article reviews the recent research progress in the electrodeposition of Bi2Te3 and its application in TE devices. Additionally, an outlook towards the future development of this area has also been discussed.

Recent advances of electrodeposition of Bi2Te3 and its thermoelectric applications in miniaturized power generation and cooling

A laser ultrasonics approach to remotely characterize the elastic and thermal properties of a coating-substrate structure, used to protect fuel claddings in lead-bismuth eutectic cooled nuclear reactors, is presented and validated with experimental results. A transient grating geometry is used for multiple wavelength excitation of thermoelastic displacements, and laser beam deflection for detection. The value of Young’s modulus of the coating layer as calculated from the coating’s Rayleigh velocity of 190 ± 50 GPa is in accordance with a nano-indentation measurement. Using a priori knowledge concerning the density and elastic parameters of the coating and substrate, scanning the sample allows the obtaining of a coating thickness map in a fully remote, all-optical way, with an accuracy of about 4 microns for a coating of around 20-micron average thickness. Analyzing the transient thermal grating decay yields a thermal diffusivity value of ( 5.0 ± 1.6 ) × 10 − 6 m 2 /s, in the range of low-carbon steels. The consistency of the results infers that the all-optical laser ultrasonics approach should be feasible for remote inspection of the quality of optically rough coated claddings in the harsh environment of a nuclear reactor.

Remote Thermoelastic Characterization of Candidate Structural and Protective Coatings for Lead-Bismuth Eutectic Cooled Nuclear Reactors

Nanocrystalline Bi2Te3 thin films of 800 nm thickness synthesized via thermal evaporation method were annealed at various temperatures that induced notable changes in both structural and optical characteristics. Structural analysis... 

pdf/temperature-dependence-raman-and-photo-response-study-of-3x9p5uru7b.pdf

Temperature dependence Raman and photo response study of Bi2Te3 thin films annealed at different temperatures for improved optoelectronic performance

Measuring the thermoelectric transport properties of a material is a prerequisite to determining its usefulness for application in waste heat recovery or cooling and the basis for devising improvement strategies. While well-established characterization methods exist for bulk samples, characterization of microscale samples remains challenging. This usually results in incomplete characterization such as restriction to study of the thermal transport properties, which can be misleading. While elaborate microdevices for complete thermoelectric characterization have been fabricated, a demanding transfer of the samples onto these devices is generally required and establishing sufficient electrical contact can be challenging in this case. Therefore a complete and transfer free in-plane characterization method for samples obtained by deposition processes was developed. The approach is based on expanding a well-established self-heating technique for the measurement of electrical and thermal conductivity to allow, in addition, for the measurement of the Seebeck coefficient. The fabrication exclusively involves photolithography and wet etching, with no need for other steps like electron-beam lithography and a lift-off process. The accuracy of the method is verified by numerical studies closely mimicking the actual measurement process, comparison to measurements on simultaneously deposited reference samples and results from literature.

Development of microdevices for the in-plane thermoelectric characterization of deposited films

Electrodeposition of bismuth telluride thin films containing silica nanoparticles for thermoelectric applications

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Electrodeposition of bismuth telluride thin films containing silica nanoparticles for thermoelectric applications