Leif Gerward
University of Copenhagen
5 Papers
6 Citations
Leif Gerward is an academic researcher from University of Copenhagen. The author has contributed to research in topics: Supercooling & Amorphous metal. The author has an hindex of 5, co-authored 5 publications.
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Papers
Grain-size effect on pressure-induced semiconductor-to-metal transition in ZnS
TL;DR: In this article, the grain-size effect on the semiconductor-to-metal transition in ZnS has been investigated by in situ high-pressure electrical resistance and optical measurements.
Pressure effect on crystallization of metallic glass Fe72P11C6Al5B4Ga2 alloy with wide supercooled liquid region
J.Z. Jiang,J. S. Olsen,Leif Gerward,S. Abdali,Jürgen Eckert,N. Schlorke-de Boer,Ludwig Schultz,J. Truckenbrodt,P. X. Shi +8 more
TL;DR: In this article, the effect of pressure on the crystallization behavior of metallic glass Fe72P11C6Al5B4Ga2 alloy with a wide supercooled liquid region was investigated by in situ high-pressure and high-temperature x-ray diffraction measurements using synchrotron radiation.
Investigations of the Phase Transition in V3O5 Using Energy Dispersive X-Ray Diffraction and Synchrotron Radiation White Beam X-Ray Topography†
TL;DR: In this paper, the authors studied the reversible first order phase transition in V3O5 at Tt = 155 °C using a specially constructed oven, where the temperature can be kept constant within a few hundredths of a degree for several hours.
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Phase transformation and conductivity in nanocrystal PbS under pressure
TL;DR: In this paper, the grain size effect on the phase transition induced by pressure in PbS was studied by in situ high-pressure electrical resistance and synchrotron radiation x-ray powder diffraction measurements.
Glass transition, crystallization kinetics and pressure effect on crystallization of ZrNbCuNiBe bulk metallic glass
TL;DR: In this article, the glass transition behavior and crystallization kinetics of Zr48Nb8Cu14Ni12Be18 bulk metallic glass have been investigated by differential scanning calorimetry and x-ray powder diffraction (XRD).