Kent Whitfield
UL
9 Papers
43 Citations
Kent Whitfield is an academic researcher from UL. The author has contributed to research in topics: Photovoltaic system & Thermal energy. The author has an hindex of 4, co-authored 9 publications. Previous affiliations of Kent Whitfield include SunEdison.
Chat about Author
Papers
Evaluation of High-Temperature Exposure of Photovoltaic Modules
Sarah Kurtz,Kent Whitfield,GovindaSamy TamizhMani,Michael Koehl,David C. Miller,James Joyce,John H. Wohlgemuth,Nick Bosco,Michael D. Kempe,Timothy Zgonena +9 more
TL;DR: In this article, the cumulative thermal degradation is modeled to follow Arrhenius behavior, and the data are analyzed to determine the constant temperature that would give average aging equivalent to the variable temperatures observed in the field.
Evaluation of high-temperature exposure of rack-mounted photovoltaic modules
Sarah Kurtz,Kent Whitfield,David C. Miller,James Joyce,John H. Wohlgemuth,Michael D. Kempe,Neelkanth G. Dhere,Nick Bosco,Timothy Zgonena +8 more
- 07 Jun 2009
TL;DR: The IEC 61730 specification requires all polymeric materials used in a photovoltaic module to have a Relative Thermal Index (RTI) or Relative Thermal Endurance Index (RTE) at least 20°C greater than the maximum material temperature measured during the temperature test conducted at 40°C ambient as discussed by the authors.
81
Damp heat versus field reliability for crystalline silicon
Kent Whitfield,Asher Salomon,Shuying Yang,Itai Suez +3 more
- 03 Jun 2012
TL;DR: In this article, a multi-stress analysis of selected silicon PV cells due to metallic corrosion was performed and it was shown that the time-to-failure is a system effect and the kinetics of the reactions are different for different cells.
25
Qualification Testing versus Quantitative Reliability Testing of PV – Gaining Confidence in a Rapidly Changing Technology
Sarah Kurtz,Kent Whitfield,Nancy H. Phillips,T. Sample,Christos Monokroussos,E. Hsi,Ingrid Repins,Peter Hacke,Dirk Jordan,John H. Wohlgemuth,P. Seidel,U. Jahn,Michael D. Kempe,Tadanori Tanahashi,Y. Chen,B. Jaeckel,Masaaki Yamamichi +16 more
- 08 Nov 2017
TL;DR: In this paper, the authors suggest a tiered approach to creating risk assessments, including the intended application, consequence of a possible failure, variability in the manufacturing, installation, and operation, as well as uncertainty in the measured acceleration factors, which provide the basis for predictions based on accelerated tests.
16