8 Papers
21 Citations
K. Mae is an academic researcher from Katholieke Universiteit Leuven. The author has contributed to research in topics: Magnetoresistance & Reflection high-energy electron diffraction. The author has an hindex of 4, co-authored 8 publications.
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Papers
Structure of Ag/Fe superlattices probed at different length scales
Grzegorz Gładyszewski,Kristiaan Temst,K. Mae,Rainer Schad,F Belien,Eddy Kunnen,G. Verbanck,Yvan Bruynseraede,R Moons,André Vantomme,S Blasser,Guido Langouche +11 more
TL;DR: In this article, the growth and structure of Ag(001)/Fe(001) superlattices studied in situ by reflection high-energy electron diffraction (RHEED) and ex situ by Rutherford backscattering and channeling spectroscopy (RBS/C), X-ray diffraction, and atomic force microscopy (AFM) were compared and applied to a detailed investigation of the epitaxial quality and the interface roughness.
12
Intensity profiles along the RHEED streaks for various thin film surface morphologies
TL;DR: In this paper, the intensity distribution profiles of reflection high energy electron diffraction along the reciprocal rods are calculated as a function of the grain width, the height difference between neighbouring grains (intergrain roughness), and the surface roughness of the individual grain (intragrain roughness).
10
Structural Characterization of Thin Films and Multilayer Structures
Kristiaan Temst,M. J. Van Bael,M. Baert,Erik Rosseel,V. Bruyndoncx,Christoph Strunk,G. Verbanck,K. Mae,C. Van Haesendonck,V. V. Moshchalkov,Y. Bruynseraede,Rik Jonckheere,D.G. de Groot,N.J. Koeman,R.P. Griessen +14 more
TL;DR: In this article, a comparison of atomic force microscopy and x-ray diffraction on molecular beam epitaxy grown Nb/Cu multilayers is made, showing that high-angle diffraction averages over a lateral length which is in good agreement with the typical grain size.
Low temperature giant positive magnetoresistance in Cr/Ag/Cr trilayers
G. Verbanck,Kristiaan Temst,K. Mae,M. J. Van Bael,Rainer Schad,Victor Moshchalkov,Y. Bruynseraede +6 more
TL;DR: In this article, the transport properties of MBE-grown epitaxial Cr/Ag/Cr trilayers on MgO(001) substrates were characterized by RHEED, X-ray diffraction and atomic force microscopy.
Coupling and magnetoresistance in Co/Cr/Ag/Co
Eddy Kunnen,Fg Aliev,Kristiaan Temst,G. Verbanck,K. Mae,Margriet J. Van Bael,J. Barnas,Victor Moshchalkov,Y. Bruynseraede +8 more
- 01 Jan 1998
TL;DR: In this paper, molecular beam epitaxy (MBE) prepared MgO/Co(45A)/Cr(0-40A)/Ag(0−40A/Cr( 0−20A)/Co( 45A)/MoAg(20A) multilayers were investigated using AFM and X-ray diffraction (XRD).