K. Klein
Technische Universität München
11 Papers
54 Citations
K. Klein is an academic researcher from Technische Universität München. The author has contributed to research in topics: Electron paramagnetic resonance & Dangling bond. The author has an hindex of 8, co-authored 11 publications.
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Papers
Electronic Transport in Phosphorus-Doped Silicon Nanocrystal Networks
Andre R. Stegner,Rui N. Pereira,K. Klein,Robert Lechner,Roland Dietmueller,Martin S. Brandt,Martin Stutzmann,Hartmut Wiggers +7 more
TL;DR: Investigation of the role of doping and paramagnetic states on the electronic transport of networks assembled from freestanding Si nanocrystals shows that different subsets of P-doped nanocrystal contribute to the different transport processes.
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Phosphorus doping of Si nanocrystals: Interface defects and charge compensation
TL;DR: Using electron paramagnetic resonance (EPR), Fourier transform infrared absorption (FTIR) and temperature programmed desorption (TPD), the doping of silicon nanocrystals and the interaction between intrinsic defects and dopants was investigated in this paper.
27
Electronic transport through Si nanocrystal films: Spin-dependent conductivity studies
Rui N. Pereira,Andre R. Stegner,K. Klein,Robert Lechner,Roland Dietmueller,Hartmut Wiggers,Martin S. Brandt,Martin Stutzmann +7 more
TL;DR: In this paper, the authors investigated paramagnetic defects and their influence on the charge transport in thin films composed of Si nanocrystals by means of electrically detected magnetic resonance (EDMR) and conventional electron paramagnetic resonance (EPR).
9
The electrically detected magnetic resonance microscope: Combining conductive atomic force microscopy with electrically detected magnetic resonance
K. Klein,Benedikt Hauer,Benedikt Stoib,Markus Trautwein,Sonja Matich,Hans Huebl,Oleksandr Astakhov,Friedhelm Finger,Robert Bittl,Martin Stutzmann,Martin S. Brandt +10 more
TL;DR: In this paper, the authors present a scanning probe microscope which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM).