Jun Uozumi
Hokkaido University
7 Papers
79 Citations
Jun Uozumi is an academic researcher from Hokkaido University. The author has contributed to research in topics: Diffraction & Fraunhofer diffraction. The author has an hindex of 5, co-authored 7 publications.
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Papers
Fresnel diffraction by one-dimensional regular fractals
TL;DR: In this paper, the authors investigated the properties of the Fresnel diffraction field produced by a Cantor bars aperture and found that intensity distributions on the optical axis have a periodicity which includes symmetry, when plotted against a 2/( lambda z) where a is the length of an object, lambda is the illumination wavelength and z is the distance of an observation point from the object.
61
Laser diffraction by randomized Koch fractals
TL;DR: In this article, the authors used Gaussian random numbers for the values of parameters specifying the arrangements of the line segments in a generator of Koch curves to obtain diffraction patterns of unusual appearance.
18
Optical diffraction by regular and random Koch fractals
Jun Uozumi,Hiroyuki Kimura,Toshimitsu Asakura +2 more
- 01 Jul 1990
TL;DR: In this article, the dimensionality of regular Koch curves and their diffraction patterns are discussed and extended to the randomized Koch curves, which are more complicated fractals in the sense that they may contain a rotational operation in their generation.
3
Scaling Properties of Fresnel Diffraction Field by Regular Fractals
Y Sakurada,Jun Uozumi,Toshimitsu Asakura +2 more
- 23 Jul 1993
TL;DR: The use of zone plate optics for soft x-rays is discussed in this article, and novel possibilities aimed at the implementation of laboratory-scale x-ray microscopes are proposed.
1
Scaling properties of the Fresnel diffraction field produced by one-dimensional regular fractals
TL;DR: In this article, the scaling properties of the Fresnel diffraction field produced by one-dimensional self-similar objects are investigated by numerical evaluations of the Fourier integral, and a degree of the selfsimilarity defined by a correlation coefficient of corresponding diffraction patterns is employed.