Jun Okamoto
Siemens
1 Papers
119 Citations
Jun Okamoto is an academic researcher from Siemens. The author has contributed to research in topics: Artifact (error) & Electroencephalography. The author has an hindex of 1, co-authored 1 publications.
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Papers
Stepping stone sampling for retrieving artifact-free electroencephalogram during functional magnetic resonance imaging
Kimitaka Anami,Takeyuki Mori,Fumiko Tanaka,Yusuke Kawagoe,Jun Okamoto,Masaru Yarita,Takashi Ohnishi,Masato Yumoto,Hiroshi Matsuda,Osamu Saitoh +9 more
TL;DR: Fast Fourier transform analysis revealed that even from DC up to 120 Hz, retrieved EEG data during scanning had very similar power distributions to the data retrieved during no scanning, implying the availability of the high-frequency band of the retrieved EEG signals, including even the gamma band.
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