Juergen Kirschner
1 Papers
2 Citations
Juergen Kirschner is an academic researcher. The author has contributed to research in topics: Conductive atomic force microscopy & Scanning probe microscopy. The author has an hindex of 1, co-authored 1 publications.
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Papers
Nanoscale imaging of photoelectrons using an atomic force microscope
Ping Yu,Juergen Kirschner +1 more
TL;DR: In this paper, photoelectrons emitted from the sample are collected by the tip while the tip-sample distance is precisely controlled by their van der Waals force interaction, which can be attributed to the strong dependence of the local potential barrier on the tip sample distance.
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