1 Papers
Juan Le is an academic researcher from Tianjin Polytechnic University. The author has contributed to research in topics: Convolution & Kernel (image processing). The author has an hindex of 1, co-authored 1 publications.
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Papers
Automatic fabric defect detection using a wide-and-light network
TL;DR: This work proposes a wide-and-light network structure based on Faster R-CNN for detecting common fabric defects and improves the accuracy of fabric defect detection and reduces the size of the model.
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