Josep Montserrat
Spanish National Research Council
146 Papers
784 Citations
Josep Montserrat is an academic researcher from Spanish National Research Council. The author has contributed to research in topics: Ion implantation & Gate oxide. The author has an hindex of 19, co-authored 146 publications. Previous affiliations of Josep Montserrat include Autonomous University of Barcelona.
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Papers
Electrical response of MOSiC gas sensors to CO, NO/sub 2/ and C/sub 3/H/sub 8/
Olga Casals,Francisco Hernandez-Ramirez,B. Barcones,Albert Romano-Rodriguez,Christophe Serre,Alejandro Pérez-Rodríguez,J. R. Morante,Phillippe Godignon,Josep Montserrat,José Antonio Alloza Millán +9 more
- 06 Sep 2005
TL;DR: In this article, the behavior of high temperature gas sensors of MOS capacitors and tunnel MOS diodes with Pt/TaSi/sub x/ catalytic gates fabricated on 6H-SiC substrates is presented.
Accelerated test for reliability analysis of SiC diodes
Viorel Banu,Xavier Jordà,Josep Montserrat,Philippe Godignon,José Millan,Pierre Brosselard +5 more
- 14 Jun 2009
TL;DR: In this article, a dedicated test bench was developed for the surge current and the power cycling reliability tests, which allows an accelerated reliability test, 105 cycles takes just 3 hours. But the authors did not consider the effect of the diode's self-heating.
Collections from the Royal Spanish Expeditions to Latin America in the Institut Botànic de Barcelona (BC), Spain
TL;DR: Ibanez et al. as discussed by the authors presented a collection from the Royal Spanish Expeditions to Latin America conserved in the Institut Botanic de Barcelona, comprising 695 specimens, illustrating the changing fortunes in the study of the flora of tropical America by Spanish botanists and their herbarium material.
Experimental analysis of planar edge terminations for high voltage 4H-SiC devices
Victor Soler,Maxime Berthou,A. Mihaila,Josep Montserrat,Philippe Godignon,Jose Rebollo,José Millan +6 more
- 12 Nov 2015
TL;DR: The edge termination combining JTE and FGRs shows a better tolerance of the JTE dose for maximizing the breakdown voltage, and the same edge termination design allows obtaining a good efficiency for both 2 and 5kV PiN diodes.