The degradation of photovoltaic (PV) systems is one of the key factors to address in order to reduce the cost of the electricity produced by increasing the operational lifetime of PV systems. To reduce the degradation, it is imperative to know the degradation and failure phenomena. This review article has been prepared to present an overview of the state-of-the-art knowledge on the reliability of PV modules. Whilst the most common technology today is mono- and multi-crystalline silicon, this article aims to give a generic summary which is relevant for a wider range of photovoltaic technologies including cadmium telluride, copper indium gallium selenide and emerging low-cost high-efficiency technologies. The review consists of three parts: firstly, a brief contextual summary about reliability metrics and how reliability is measured. Secondly, a summary of the main stress factors and how they influence module degradation. Finally, a detailed review of degradation and failure modes, which has been partitioned by the individual component within a PV module. This section connects the degradation phenomena and failure modes to the module component, and its effects on the PV system. Building on this knowledge, strategies to improve the operational lifetime of PV systems and thus, to reduce the electricity cost can be devised. Through extensive testing and failure analysis, researchers now have a much better overview of stressors and their impact on long term stability. • Review of reliability metrics and test methodologies for photovoltaic modules • Indicative mapping of relationships between stressors, components, failures and effects in PV modules. • Assessment on the impact of degradation and failure on LCOE and EPBT. • Review of design considerations for all components in a PV module regarding reliability. 

Review of degradation and failure phenomena in photovoltaic modules

Impact of cracks on crystalline silicon photovoltaic modules temperature distribution

Photovoltaic module failures after 10 years of operation in the tropics

Long-term photovoltaic (PV) module reliability is highly determined by the durability of the polymeric components (backsheet and encapsulation materials) This paper presents the result of experiments on encapsulant degradation influenced by the backsheet permeation properties Towards this goal, one type of ethylene/vinyl acetate copolymer (EVA) was aged in glass/EVA/backsheet laminates in accelerated aging tests (up to 4000 h for Damp-Heat (DH) and up to 480 kWh/m2 for UV and UV-DH combined) The samples contained three backsheets with different permeation properties to examine their impact on EVA degradation Thermal and chemical characterization shows that the EVA degradation is stronger with the glass–EVA–polyamide (PA)-based backsheet than with the polyethylene terephthalate (PET)-based backsheets The higher oxygen transmission rate (OTR) of the PA-based backsheet may increase photo-oxidation and aggravating the degradation of EVA in the laminates Furthermore, FTIR results were used to demonstrate the effect of damp heat exposure on the EVA interfaces, showing an accelerated degradation at the glass–EVA interface The comparison of accelerated aging stress factors reveals that EVA suffers the strongest chemical and optical degradation when high UV, high temperature and high relative humidity are combined simultaneously

Effect of Backsheet Properties on PV Encapsulant Degradation during Combined Accelerated Aging Tests

Use of indentation to study the degradation of photovoltaic backsheets

Application of stress factors in the combinations and sequences as they occur in the natural environment better reproduces failures seen in the field. Further, choice of sample type for testing that best represents the final product is most likely to yield relevant results. Tests meeting these criteria are more likely to discover potential weaknesses that are not a priori known in new module designs, reduce risk, accelerate time to market, achieve bankability and reduce costly overdesign.

Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules

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Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules