Joachim Ullrich
German National Metrology Institute
552 Papers
3.4K Citations
Joachim Ullrich is an academic researcher from German National Metrology Institute. The author has contributed to research in topics: Ionization & Ion. The author has an hindex of 70, co-authored 551 publications. Previous affiliations of Joachim Ullrich include University of Freiburg & Goethe University Frankfurt.
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Papers
Pit formation on poly(methyl methacrylate) due to ablation induced by individual slow highly charged ion impact
R. Ritter,Richard A. Wilhelm,R. Ginzel,G. Kowarik,René Heller,A.S. El-Said,R. M. Papaléo,W. Rupp,J. R. Crespo López-Urrutia,Joachim Ullrich,Stefan Facsko,Friedrich Aumayr +11 more
TL;DR: In this paper, the formation of nano-sized pits on poly(methyl methacrylate) after exposure to slow highly charged ion beams was reported, where the pits are formed on the polymer surface as a direct result of individual ion impacts.
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Target Dependence of Slow Electrons Emitted in Swift Ion-Atom Collisions
TL;DR: In this paper, a detailed study of the emission from each initial orbital of the target atom reveals features in the spectra which can be related to the structure of the initial-state bound wave function.
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Differential cross sections for single and double ionization of helium by protons and antiprotons
TL;DR: Theoretical and experimental cross sections for single and double ionization of He differential in the projectile scattering angle and the transverse energy of the outgoing recoil ion are presented in this article.
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Laser-assisted electron-impact ionization of atoms
TL;DR: In this paper, the first experiment for laser-assisted ionization was performed and the resulting double and triple-differential cross-sections for the single ionization showed significant differences in comparison to the field-free crosssections.
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From non-sequential to sequential strong-field multiple ionization: identification of pure and mixed reaction channels
Artem Rudenko,Th. Ergler,K. Zrost,Bernold Feuerstein,V. L. B. de Jesus,C. D. Schröter,R. Moshammer,Joachim Ullrich +7 more
TL;DR: In this article, a reaction microscope was used to characterize the transition regime between non-sequential and sequential strong-field ionizations, showing that pure and/or mixed recollision-induced (e, ne)-like reactions and sequential (field-induced) processes can be distinguished.
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