The invention relates to the technical field of optical fiber communication, and particularly discloses a method for calibrating, compensating and self-correcting parameters of an optical module. The method comprises the steps of: (1) parameter calibration, i.e., reading read-out values of each monitored parameter of the optical module at different temperatures, acquiring corresponding actual values, obtaining a calibration formula and calibrating each monitored parameter by the calibration formula; (2) parameter compensation, i.e., by using a module output at the normal temperature as a reference value, regulating parameter setting of an optical module register to enable an actual module output to be approximate to the reference value, and fitting into a compensation formula; and (3) parameter self-correction, i.e., comparing an output value of each calibrated parameter with an ideal value, and if a large deviation exists, fine regulating the parameter according to a deviation direction, correcting an output effect, and regulating a parameter value of the compensation formula in the step (2). According to the method disclosed by the invention, workload of a worker is reduced, and accuracy and reliability of each parameter index of the optical module are improved.

Method for calibrating, compensating and self-correcting parameters of optical module

The invention discloses an LED service life prediction method under an actual operation environment and belongs to the LED product test technology field The method is characterized by through acceleration test report data, establishing a single LED service life model and a batch of LED service life models possessing a same acceleration factor; and through constructing an internal junction temperature feedback system graph of a key factor p-n junction influencing an LED service life, acquiring a real-time junction temperature during LED work According to the real-time junction temperature during LED working and the batch of LED service life models, the LED service life is predicted The method is suitable for various kinds of LED work current and extraneous environment temperature change occasions A method of actually predicting a certain proportion of LED-failure required time under various confidence or confidence intervals is provided The method is good for guiding LED heat dissipation and a system design, a service life and reliability of an LED illumination product are increased, and the method can be popularized in an LED driver and service life prediction of a whole LED illumination system

LED service life prediction method under actual operation environment

The invention discloses an integrated circuit high-temperature aging test system The integrated circuit high-temperature aging test system includes an upper computer, a tester and a mechanical arm, wherein the upper computer transmits test data to the tester, the mechanical arm put an integrated circuit in or take the integrated circuit out under the control of the tester, and the tester comprises a tester shell, a power supply interface, a communication interface, an input device, an output device, a tester main control board, a functional test board card and a high-temperature aging test device, wherein the power supply interface is used for supplying power for the tester, the communication interface is used for transmitting the test data, the input device is used for controlling the tester main control board to perform testing, the output device is used for outputting test results, the tester main control board is used for controlling the functional test board card, and the high temperature aging test device carries out or terminates the testing The invention also discloses an integrated circuit high-temperature aging test method With the integrated circuit high-temperature aging test system and high-temperature aging test method of the invention adopted, test cost and test space can be greatly reduced

Integrated circuit high-temperature aging test system and high-temperature aging test method

The invention relates to the LED product testing technology field and particularly relates to a temperature control method for an LED driver reliability acceleration test. The temperature control method comprises steps for the LED driver reliability acceleration test comprises steps of obtaining temperature of a component of an LED driver which needs to heat locally and an extra temperature increase under a condition that acceleration factors of each component of a tested LED driver are identical, adopting an ultraviolet light source to irradiate the component of the LED driver which needs to heat locally, using an infrared imaging instrument to test a surface temperature of each component of the tested LED driver, and adjusting the ultraviolet radiation intensity of the ultraviolet light source according to a step measurement result until a temperature requirement is satisfied. The temperature control method for the LED driver reliability acceleration test can perform local heating on components of multiple LED drivers synchronously while performing integral heating on the LED driver to accelerate aging, guarantees acceleration factors of the components of each LED driver are basically identical and thus improves accuracy of the reliability acceleration test of the LED driver.

Temperature control method for LED driver reliability acceleration test

The invention relates to the technical field of semiconductor illumination and photoelectric testing, and provides a method and device for measuring the service life of an LED. The method comprises the steps of acquiring measurement data of a test sample under a first condition; fitting a first changing curve of changes of internal quantum efficiency of the test sample at a preset temperature following the changes of a plurality of preset current corresponding to the preset temperature; according to the first change curve of the internal quantum efficiency of the test sample at each preset temperature, finding a corresponding preset temperature when the internal quantum efficiency reaches a preset threshold, and setting the preset temperature as a test temperature for determining the service life of the LED. In the method, the acquisition of the measurement data of the test sample is simple in operation and short in testing time, the whole test can be completed in one day or several hours, and the test efficiency is greatly improved compared with 7-10 days of the prior art.

Method and device for measuring service life of LED

The invention discloses a test device and a test method for the performance of a photovoltaic module in the high-temperature environment. The device comprises a high-temperature oven and further comprises an external test board. An internal test board is mounted in the high-temperature oven and connected with the external test board, and an output end of the external test board is transmitted to a computer. According to the test device and the test method, the heating test is performed on the whole photovoltaic module directly, sample data of 5 key parameters of the photovoltaic module under the temperature change are acquired, and the sample data are calculated through an Arrhenius model, accordingly, the service life of the photovoltaic module under the normal condition is evaluated; and testing can be performed without stripping a light-emitting diode (LED), and scale applications of the test are facilitated; and accelerated factors corresponding to the optimum test temperature can obtain a maximum value. When the test is performed on the temperature, the test time is actually far shorter than time required by the test performed at the specified temperature, the test time is only about 5% of the prior test time, and the test time is greatly shortened.

Test device and test method for performance of photovoltaic module in high-temperature environment

Determination method for optimal test temperature of light-emitting diode (LED) accelerated aging tests

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Test device and test method for performance of photovoltaic module in high-temperature environment

Determination method for optimal test temperature of light-emitting diode (LED) accelerated aging tests