Jian Wang
11 Papers
283 Citations
Jian Wang is an academic researcher. The author has contributed to research in topics: Nanoimprint lithography & Lithography. The author has an hindex of 7, co-authored 11 publications.
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Papers
Patent
Structures for polarization and beam control
Xuegong Deng,Jian Wang,Feng Liu +2 more
- 03 Nov 2005
TL;DR: In this paper, the first layer is configured to transmit about 50% or more of the radiation of wavelength λ having a first polarization state incident on first layer along a path and to specularly reflect about 80% or less of radiation having the second polarization incident on the article along the path, where the path intersects the first and second layers.
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Patent
Films for optical use and methods of making such films
Anguel Nikolov,Jian Wang,Xu Ouyang,Feng Liu,Jiangdong Deng,Xuegong Deng,Greg E. Blonder,Ronnie Varghese +7 more
- 10 May 2004
TL;DR: In this article, a multilayer film defining an optical axis is defined, where the optical filter transmits 50% of the light having a wavelength λ 1 propagating along the optical axis, and the optical filtering unit transmits the remaining 50% having λ 2 incident on the multillayer film at an angle of 30 degrees with respect to the optic axis.
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Patent
Precision phase retardation devices and method of making same
Anguel Nikolov,Jian Wang,Xuegong Deng,Wei Zhang,Greg E. Blonder +4 more
- 01 Aug 2003
TL;DR: In this paper, a birefringent device of substantially uniform thickness less than about 10 microns, and being suitable for operating in a wavelength range about a central wavelength is disclosed.
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Patent
Method and system for providing beam polarization
Jian Wang,Xuegong Deng,Greg E. Blonder,Erli Chen +3 more
- 20 Aug 2003
TL;DR: In this paper, a radiation polarizer, controller, and a method of radiation polarization and beam control are disclosed, which includes a substrate (14), at least one anti-reflection coating layer (32), and at least two nanostructures (22) communicatively coupled to the substrate.
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Defect control in nanoimprint lithography
TL;DR: In this article, a dry clean process for the nanostructure-patterned surface is explored to remove the particles, and the gap-associated defect is a unique phenomenon in NIL, which is induced by the incomplete contact between mold and substrate.
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