Advances in manufacturing process technology are key ensembles for the production of integrated circuits in the sub-micrometer region. It is of paramount importance to assess the effects of tolerances in the manufacturing process on the performance of modern integrated circuits. The polynomial chaos expansion has emerged as a suitable alternative to standard Monte Carlo-based methods that are accurate, but computationally cumbersome. This paper provides an overview of the most recent developments and challenges in the application of polynomial chaos-based techniques for uncertainty quantification in integrated circuits, with particular focus on high-dimensional problems.

https://biblio.ugent.be/publication/8566050/file/8566051.pdf

Review of Polynomial Chaos-Based Methods for Uncertainty Quantification in Modern Integrated Circuits

Fabrication process variations are a major source of yield degradation in the nanoscale design of integrated circuits (ICs), microelectromechanical systems (MEMSs), and photonic circuits. Stochastic spectral methods are a promising technique to quantify the uncertainties caused by process variations. Despite their superior efficiency over Monte Carlo for many design cases, stochastic spectral methods suffer from the curse of dimensionality, i.e., their computational cost grows very fast as the number of random parameters increases. In order to solve this challenging problem, this paper presents a high-dimensional uncertainty quantification algorithm from a big data perspective. Specifically, we show that the huge number of (e.g., $1.5 \times 10^{27}$ ) simulation samples in standard stochastic collocation can be reduced to a very small one (e.g., 500) by exploiting some hidden structures of a high-dimensional data array. This idea is formulated as a tensor recovery problem with sparse and low-rank constraints, and it is solved with an alternating minimization approach. The numerical results show that our approach can efficiently simulate some IC, MEMS, and photonic problems with over 50 independent random parameters, whereas the traditional algorithm can only deal with a small number of random parameters.

Big-Data Tensor Recovery for High-Dimensional Uncertainty Quantification of Process Variations

This paper presents a systematic approach for the statistical simulation of nonlinear networks with uncertain circuit elements. The proposed technique is based on spectral expansions of the elements' constitutive equations (I-V characteristics) into polynomial chaos series and applies to arbitrary circuit components, both linear and nonlinear. By application of a stochastic Galerkin method, the stochastic problem is cast in terms of an augmented set of deterministic constitutive equations relating the voltage and current spectral coefficients. These new equations are given a circuit interpretation in terms of equivalent models that can be readily implemented in SPICE-type simulators, as such allowing to take full advantage of existing algorithms and available built-in models for complex devices, like diodes and MOSFETs. The pertinent statistical information of the entire nonlinear network is retrieved via a single simulation. This approach is both accurate and efficient with respect to traditional techniques, such as Monte Carlo sampling. Application examples, including the analysis of a diode rectifier, a CMOS logic gate and a low-noise amplifier, validate the methodology and conclude the paper.

/pdf/stochastic-modeling-of-nonlinear-circuits-via-spice-1ty3oslgz8.pdf

Stochastic Modeling of Nonlinear Circuits via SPICE-Compatible Spectral Equivalents

Process variations can significantly degrade device performance and chip yield in silicon photonics. In order to reduce the design and production costs, it is highly desirable to predict the statistical behavior of a device before the final fabrication. Monte Carlo is the mainstream computational technique used to estimate the uncertainties caused by process variations. However, it is very often too expensive due to its slow convergence rate. Recently, stochastic spectral methods based on polynomial chaos expansions have emerged as a promising alternative, and they have shown significant speedup over Monte Carlo in many engineering problems. The existing literature mostly assumes that the random parameters are mutually independent. However, in practical applications such assumption may not be necessarily accurate. In this paper, we develop an efficient numerical technique based on stochastic collocation to simulate silicon photonics with correlated and non-Gaussian random parameters. The effectiveness of our proposed technique is demonstrated by the simulation results of a silicon-on-insulator based directional coupler example. Since the mathematic formulation in this paper is very generic, our proposed algorithm can be applied to a large class of photonic design cases as well as to many other engineering problems.

Uncertainty quantification of silicon photonic devices with correlated and non-Gaussian random parameters.

This paper presents hybrid automaton modeling, comparative model validation, and formal verification of stability through reachability analysis of pulse width modulation (PWM) dc–dc converters. Conformance degree provides a measure of closeness between the proposed hybrid automata models and experimental data. Nondeterminism due to variations in circuit parameters is modeled using interval matrices. In direct contrast to the unsound and computationally-intensive Monte Carlo simulation, reachability analysis is introduced to overapproximate the set of reachable states and ensure stable operation of PWM dc–dc converters. Using a 200 W experimental prototype of a buck converter, hybrid automata models of open-loop, and hysteresis-controlled converters are first validated against experimental data using their conformance degrees. Next, converter stability is formally verified through reachability analysis and informally validated using Monte Carlo simulations and experimental results.

Model Validation of PWM DC–DC Converters

Process variations are a major concern in today's chip design since they can significantly degrade chip performance. To predict such degradation, existing circuit and MEMS simulators rely on Monte Carlo algorithms, which are typically too slow. Therefore, novel fast stochastic simulators are highly desired. This paper first reviews our recently developed stochastic testing simulator that can achieve speedup factors of hundreds to thousands over Monte Carlo. Then, we develop a fast hierarchical stochastic spectral simulator to simulate a complex circuit or system consisting of several blocks. We further present a fast simulation approach based on anchored ANOVA (analysis of variance) for some design problems with many process variations. This approach can reduce the simulation cost and can identify which variation sources have strong impacts on the circuit's performance. The simulation results of some circuit and MEMS examples are reported to show the effectiveness of our simulator

Stochastic Testing Simulator for Integrated Circuits and MEMS: Hierarchical and Sparse Techniques

Due to significant manufacturing process variations, the performance of integrated circuits (ICs) has become increasingly uncertain. Such uncertainties must be carefully quantified with efficient stochastic circuit simulators. This paper discusses the recent advances of stochastic spectral circuit simulators based on generalized polynomial chaos (gPC). Such techniques can handle both Gaussian and non-Gaussian random parameters, showing remarkable speedup over Monte Carlo for circuits with a small or medium number of parameters. We focus on the recently developed stochastic testing and the application of conventional stochastic Galerkin and stochastic collocation schemes to nonlinear circuit problems. The uncertainty quantification algorithms for static, transient and periodic steady-state simulations are presented along with some practical simulation results. Some open problems in this field are discussed.

Uncertainty Quantification for Integrated Circuits: Stochastic Spectral Methods

This brief paper proposes an uncertainty quantification method for the periodic steady-state (PSS) analysis with both Gaussian and non-Gaussian variations. Our stochastic testing formulation for the PSS problem provides superior efficiency over both Monte Carlo methods and existing spectral methods. The numerical implementation of a stochastic shooting Newton solver is presented for both forced and autonomous circuits. Simulation results on some analog/RF circuits are reported to show the effectiveness of our proposed algorithms.

Efficient Uncertainty Quantification for the Periodic Steady State of Forced and Autonomous Circuits

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Stochastic Testing Simulator for Integrated Circuits and MEMS: Hierarchical and Sparse Techniques

Uncertainty Quantification for Integrated Circuits: Stochastic Spectral Methods

Efficient Uncertainty Quantification for the Periodic Steady State of Forced and Autonomous Circuits