379 Papers
1.8K Citations
Huy Nguyen is an academic researcher from Hanoi University of Science and Technology. The author has contributed to research in topics: Computer science & Medicine. The author has an hindex of 46, co-authored 308 publications. Previous affiliations of Huy Nguyen include Stanford University & Vietnam National University, Ho Chi Minh City.
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Papers
Frequency of alcohol and smoking cessation counseling in hepatitis C patients among internists and gastroenterologists.
TL;DR: It is revealed that internists and gastroenterologists, alike, inadequately counsel patients with hepatitis C about tobacco and alcohol use.
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Image-Text Out-Of-Context Detection Using Synthetic Multimodal Misinformation
Fatma Shalabi,Huy Nguyen,Hichem Felouat,Ching-Chun Chang,Isao Echizen +4 more
- 31 Oct 2023
TL;DR: This work investigated a novel approach to Out-Of-Context detection (OOCD) that uses synthetic data generation and created a dataset specifically designed for OOCD and developed an efficient detector for accurate classification.
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Fair Range k-center
TL;DR: This work proposes a variant of fairness which restricts each group’s number of centers with both a lower bound (minority-protection) and an upper bound (restricted-domination) and provides both an offline and one-pass streaming algorithm for the problem.
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•Posted Content
Adaptive and Universal Single-gradient Algorithms for Variational Inequalities.
Alina Ene,Huy Nguyen +1 more
- 15 Oct 2020
TL;DR: These algorithms use a single operator evaluation per iteration and automatically adapt to problem parameters such as smoothness and simultaneously achieve the optimal convergence rates in the non-smooth, smooth, and stochastic settings.
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Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits
TL;DR: Application of partial reset BIST provides a low cost alternative for testing sequential circuits when scan design is unacceptable due to area and/or delay constraints and yields an average improvement of 15% in fault-coverage for sequential circuits resistant to random pattern testing.
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