Honghua Yang
University of Colorado Boulder
17 Papers
63 Citations
Honghua Yang is an academic researcher from University of Colorado Boulder. The author has contributed to research in topics: Near and far field & Spectroscopy. The author has an hindex of 6, co-authored 17 publications.
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Papers
Optical dielectric function of silver
Honghua Yang,Jeffrey D'Archangel,Michael L. Sundheimer,Eric Tucker,Glenn D. Boreman,Markus B. Raschke +5 more
TL;DR: Using broadband spectroscopic ellipsometry, the complex valued dielectric function of silver films from 0.05 eV to 4.14 eV with a statistical uncertainty of less than 1% was determined in this article.
The thermal near-field: Coherence, spectroscopy, heat-transfer, and optical forces
TL;DR: In this article, the spectral, spatial, resonant, and coherence properties of the evanescent thermal near-field have been characterized for systems with thermally excited molecular, surface plasmon polariton, and surface phonon polariton (SPhP) resonances.
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Accessing the Optical Magnetic Near-Field through Babinet’s Principle
Honghua Yang,Robert L. Olmon,Kseniya S. Deryckx,Xiaoji G. Xu,Hans A. Bechtel,Yuancheng Xu,Brian A. Lail,Markus B. Raschke +7 more
TL;DR: In this article, the authors identify magnetic dipole and higher order bright and dark magnetic resonances at mid-infrared frequencies from resonant length scaling and spatial near-field distribution.
46
Substrate-enhanced photothermal nano-imaging of surface polaritons in monolayer graphene
Fabian Menges,Honghua Yang,Samuel Berweger,Anirban Roy,Tao Jiang,Tao Jiang,Markus B. Raschke +6 more
- 06 Apr 2021
TL;DR: In this article, photothermal force microscopy was used to image surface plasmon polaritons (SPPs) in monolayer graphene through their non-radiative SiO2 substrate dissipation.
Patent
Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
Honghua Yang,Craig Prater +1 more
- 29 Nov 2016
TL;DR: In this article, a method for measuring an optical property of a sub-micrometer region of a sample including interacting a probe tip of a probe microscope with a region of the sample, illuminating the sample with a beam of light from a radiation source such that light is scattered from the probe-sample interaction region.
6