Hong-Liang Lu
Fudan University
219 Papers
776 Citations
Hong-Liang Lu is an academic researcher from Fudan University. The author has contributed to research in topics: Atomic layer deposition & Thin film. The author has an hindex of 28, co-authored 170 publications. Previous affiliations of Hong-Liang Lu include Chinese Academy of Sciences & Olivetti.
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Papers
A Heterostructured Graphene Quantum Dots/β-Ga2O3 Solar-Blind Photodetector with Enhanced Photoresponsivity.
Guang Zeng,Xiao-Xi Li,Yuchun Li,Dingbo Chen,Yu-Chang Chen,Xueying Zhao,Na Chen,Tingyun Wang,David W. Chang,Hong-Liang Lu +9 more
TL;DR: In this article , a high-performance metal-semiconductor-metal (MSM) photodetector was proposed by integrating exfoliated β-Ga2O3 flakes with zero-dimensional graphene quantum dots (GQDs), which exhibits the advantages of enhancing the photoresponsivity, shortening the photoresistivity, and stimulating a broad range of photon detection.
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Hofmeister-Effect-Guided Ionohydrogel Design as Printable Bioelectronic Devices
TL;DR: A bionic strategy is elaborately developed to synthesize an ionohydrogel bioelectronic platform that possesses extracellular‐matrix‐like habitat by employing hydrated ionic liquids (HILs) as ionic solvent and bioprotectant and realizes an integration of ionic and enzymatic electronic circuits and minimization of the disparities between tissues and artificial machines.
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Structural, optical, and electrical properties of Hf-doped ZnO films deposited by atomic layer deposition
Yang Geng,Zhang-Yi Xie,Wen Yang,Sai-Sheng Xu,Qing-Qing Sun,Shi-Jin Ding,Hong-Liang Lu,David Wei Zhang +7 more
TL;DR: In this paper, the influence of Hf content on the structure, optical and electrical properties of HZO films were investigated systematically, and the X-ray diffraction spectra revealed that the grown Zn-doped zinc oxide (HZO) films have a hexagonal structure with the preferential orientation changing from a-axis to c-axis with increasing Hf-doping concentrations.
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Optical and microstructural properties of ZnO/TiO2 nanolaminates prepared by atomic layer deposition
Yu-Zhu Gu,Hong-Liang Lu,Yang Geng,Zhi-Yuan Ye,Yuan Zhang,Qing-Qing Sun,Shi-Jin Ding,David Wei Zhang +7 more
TL;DR: The data from X-ray diffraction spectra suggest that layer growth appears to be substrate sensitive and film thickness also has an influence on the crystallization of films, indicating that ZnO layers are polycrystalline with preferred (002) orientation while TiO2 layers are amorphous.
Improved photoelectrical properties of n-ZnO/p-Si heterojunction by inserting an optimized thin Al₂O₃ buffer layer.
Hong-Liang Lu,Yu-Zhu Gu,Yuan Zhang,Xin-Yan Liu,Pengfei Wang,Qing-Qing Sun,Shi-Jin Ding,David Wei Zhang +7 more
TL;DR: It is demonstrated that Al₂O₃ buffer layer with optimized thickness exhibits significant advantages in enhancing the crystal quality of ZnO film and improving the photoelectrical properties of n-ZnO/p-Si photodetectors.
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