Hao Li
Iowa State University
7 Papers
174 Citations
Hao Li is an academic researcher from Iowa State University. The author has contributed to research in topics: Microchannel & Reynolds number. The author has an hindex of 6, co-authored 6 publications.
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Papers
MicroPIV measurements of turbulent flow in square microchannels with hydraulic diameters from 200 μm to 640 μm
Hao Li,Michael G. Olsen +1 more
TL;DR: In this article, microPIV experiments were performed on square polydimethylsiloxane (PDMS) microchannels with hydraulic diameters ranging from 200μm to 640μm and for Reynolds numbers ranging from 2600 to 2900.
71
Turbulent and transitional velocity measurements in a rectangular microchannel using microscopic particle image velocimetry
TL;DR: In this paper, microPIV experiments were performed on a polydimethylsiloxane (PDMS) microchannel with a cross-section measuring 320 μm-×-330 μm for Reynolds numbers between 272 and 2853.
70
Examination of large-scale structures in turbulent microchannel flow
Hao Li,Michael G. Olsen +1 more
TL;DR: In this paper, a microscopic particle image velocimetry was performed on turbulent flow in microchannels of various diameters and aspect ratios to evaluate the characteristics of large-scale turbulent structures.
22
•Journal Article
Examination of Large-Scale Structures in Turbulent Microchannel Flow
Hao Li,Michael G. Olsen +1 more
TL;DR: In this paper, particle image velocimetry was performed on turbulent flow in microchannels of various diameters and aspect ratios to evaluate the characteristics of large-scale turbulent structures.
19
Failure Mechanism of Double-Trench (DT) 4H-SiC Power MOSFET under UIS Measurement
TL;DR: In this paper , the failure mechanism of DT 4H-SiC power MOSFET under UIS measurement is evaluated by combination of experiment and theoretical research, and it has been shown that the gate oxide at the corner of gate trench will be destroyed by UIS measurements, therefore, Device Under Test (DUT) failed.