Hai Xaio
Virginia Tech
1 Papers
14 Citations
Hai Xaio is an academic researcher from Virginia Tech. The author has contributed to research in topics: White light interferometry & Interferometry. The author has an hindex of 1, co-authored 1 publications.
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Papers
Manufacturing of a fiber optic Young’s double pinhole interferometer for use as a 3-D profilometer
TL;DR: The method used to manufacture a Young's double pinhole interferometer is presented, destined to be used in a surface profilometer using two wavelengths so that the zero order fringe can be determined.
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