Using the spin Hall effect of light, this work proposes a measurement technique of the magnetic properties of thin films. The beam shift of the spin Hall effect of light is used to replace the magneto-optical Kerr rotation angle as a parameter to characterize the magnetism of thin films. The technique can easily achieve an accuracy of 10−6 rad of the magneto-optical Kerr rotation angle which can, in theory, be further improved to 10−8 rad. We also proposed two methods to solve the problem of the exceeding linear response region of the measurement under high magnetic field intensity, making it more conducive to practical application. This technique has great potential for application in the magnetic measurement of ultra-thin films with particular emphasis on thicknesses within several atomic layers.

Measurement of the magnetic properties of thin films based on the spin Hall effect of light.

The Physical Principles of Magneto-optical Recording: Diffraction of Gaussian Beams from Sharp Edges

An advanced magneto-optical technique is described, which allows simultaneous determination of two mutually-conjugate parameters–Kerr rotation and reflectance magneto-circular dichroism–using a piezo-birefringent modulator. This technique provides a sensitivity of 0.002° for Kerr rotation at λ=500 nm with 12 nm resolution, using a halogen lamp (150 W) as the light source. The wavelength region covered by the method can be extended from 300–2500 nm by suitable selection of gratings and light detectors. The new technique was used to measure magneto-optical hysteresis loops for several wavelengths and magneto-optical spectra on an rf-sputtered amorphous Gd-Co film, and the results are reported here.

Measurement of Magneto-Optical Kerr Effect Using Piezo-Birefringent Modulator

Thin films of ferromagnetic semiconductors of the (Ga, Mn)(As, P) family are investigated by means of magneto-optical Kerr spectroscopy in order to determine the spectral dependence of the complex magneto-optical Voigt constant Q, an intrinsic parameter responsible for Kerr rotation and ellipticity. We obtain the spectral dependence of these two conjugate quantities: the Kerr rotation and ellipticity angles. Contrary to strongly absorbing metallic ferromagnetic layers, it is expected that they vary non-linearly with the layer thickness at a fixed wavelength, as a consequence of the weak absorption and the non-negligible optical phase shift in weakly absorbing semiconductor ferromagnets. We show that, from the Kerr rotation and ellipticity angles and the complex refractive index –obtained by ellipsometric measurements—we are able to determine the spectral dependence of the complex intrinsic Voigt constant, thus avoiding the need for samples with different thicknesses. Incidentally, the use of phosphorus substituted (Ga, Mn)As provides an out-of-plane magnetic easy axis, the appropriate configuration for polar magneto-optical Kerr effect, without the need for a strong external magnetic field.

https://iopscience.iop.org/article/10.1088/1361-6641/aae9af/pdf

Magneto-optical Kerr spectroscopy in ferromagnetic semiconductors: determination of the intrinsic complex magneto-optical Voigt constant

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Magneto-optical Kerr spectroscopy in ferromagnetic semiconductors: determination of the intrinsic complex magneto-optical Voigt constant