H.C. Fan
4 Papers
H.C. Fan is an academic researcher. The author has contributed to research in topics: Protein filament & Ion. The author has an hindex of 1, co-authored 2 publications.
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Papers
Influence of ICRF-NBI synergy on fast ion distribution and plasma performance in second harmonic heating experiments with deuterium NBI at EAST
W. Zhang,G. Zhu,X.J. Zhang,Guoqiang Zhong,Lin Ai,Y. Chu,Tieshuan Fan,H.C. Fan,Baolong Hao,J. Huang,Y.F. Jin,L.N. Liu,L. Y. Liao,Qing Liang,G X Wang,D.K. Yang,H. Yang +16 more
TL;DR: In this paper , the influence of ICRF-NBI synergy on fast ion distribution and plasma performance was analyzed in a typical H-mode plasma with 1.0 MW neutral beam injection and 1.5 MW ion cyclotron heating.
Simulations of plasma current induced by toroidal field ramping down on tokamaks
TL;DR: Researchers develop a new time-dependent model to simulate plasma current evolution in tokamaks during toroidal field ramping down, implemented in the ONETWO code, showing broader current profiles and reduced ohmic current.
Hot spots of the main limiter induced by fast ions in experimental advanced superconducting tokamak (EAST)
Youming Li,Y. F. Xu,X. Y. Xu,G. Xu,R. R. Liang,R. Ding,X. Liu,K. Geng,Tao Zhang,S. X. Wang,H.C. Fan,G. Q. Zhong,S. Y. Fu,D. A. Lu,S. T. Mao,J. Fu,Qiong Zhang,Lei Cao,Bo Zhang,Liang Wang,R. H. Chen,Ning Yan,Q. Q. Yang,H. Q. Liu,Y. L. Xie,X. Gong,J.S. Hu +26 more
TL;DR: In EAST, co-current perpendicular NBI enhances hot spots on the main limiter, with peak heat loads of ~0.5 MW/m², primarily caused by NBI ion loss due to toroidal field ripple and Coulomb collisions.
Study on filament width of type-I ELM in EAST using VUV imaging system and simulation
Tingfeng Ming,T Tang,Q. Shi,Feifei Long,S.W. Hou,R.J. Deng,Tian Xia,X.X. Zhang,H. Lian,X.H. Wu,H.C. Fan,B. Li,G.Q. Li,H.Q. Liu,Qiong Zhang,M. Q. Wu,H. M. Li,Baolong Hao,X. Zhou,Xiang Gao +19 more
TL;DR: In this paper , the BOUT++ nonlinear simulations have been performed with the reconstructed equilibriums from the experimental measurements in order to understand the power dependence of the filaments induced by the type-I edge localized mode.