Garrett Baucom
10 Papers
Garrett Baucom is an academic researcher. The author has contributed to research in topics: Hysteresis & Halide. The author has an hindex of 1, co-authored 2 publications.
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Papers
A multiscale ion diffusion framework sheds light on the diffusion–stability–hysteresis nexus in metal halide perovskites
Masoud Ghasemi,Boyu Guo,Kasra Darabi,Tong Sheng Wang,Kai Wang,Chiung-Wei Huang,Benjamin M. Lefler,Laine Taussig,Mihirsinh Chauhan,Garrett Baucom,Taesoo Kim,Enrique D. Gomez,Joanna M. Atkin,Shashank Priya,Aram Amassian +14 more
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Unprecedented enhancement of piezoelectricity of wurtzite nitride semiconductors via thermal annealing
Shubham Mondal,Md. Mehedi Hasan Tanim,Garrett Baucom,Shaurya Singh Dabas,Jinghan Gao,Jiangnan Liu,Zhengwei Ye,Venkateswarlu Gaddam,Aiden Ross,Long‐Qing Chen,Honggyu Kim,Roozbeh Tabrizian,Z. Mi +12 more
TL;DR: Researchers enhance piezoelectricity of wurtzite nitride semiconductors by 3.5 times via thermal annealing, achieving a 45.5 pC/N piezoelectric modulus, and promising extreme frequency scaling opportunities for beyond-5G applications.
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Aluminum Scandium Nitride as a Functional Material at 1000 °C
Venkateswarlu Gaddam,Shaurya Singh Dabas,Jinghan Gao,David J. Spry,Garrett Baucom,Nicholas G. Rudawski,Tete Yin,Ethan Angerhofer,Philip G. Neudeck,Honggyu Kim,Philip X.-L. Feng,Mark Sheplak,Roozbeh Tabrizian +12 more
Automated Phase and Orientation Mapping of Multiphase, Polycrystalline Hafnia-Zirconia Thin Films Using 4D-STEM.
TL;DR: Researchers employ 4D-STEM to automate phase and orientation mapping of multiphase, polycrystalline Hafnia-Zirconia thin films, enabling detailed characterization of complex material structures and properties.
1
Nanoscale Phase and Orientation Mapping in Multiphase Polycrystalline Hafnium Zirconium Oxide Thin Films Using 4D-STEM and Automated Diffraction Indexing.
Garrett Baucom,Eitan Hershkovitz,Paul Chojecki,Toshikazu Nishida,Roozbeh Tabrizian,Honggyu Kim +5 more
TL;DR: The development of ferroelectric hafnium zirconium oxide thin films hinges on accurate characterization of the complex phase and orientation landscape. This study introduces a novel approach using 4D-STEM and automated diffraction indexing to analyze multiphase polycrystalline HZO thin films, enabling the precise determination of phase composition, polarization axis alignment, and unique phase distribution across large working areas.
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