One approach to ultrahigh-density data storage involves the use of arrays of atomic force microscope probes to read and write data on a thin polymer film, but damage to the ultrasharp silicon probe tips caused by mechanical wear has proved problematic. Here, we demonstrate the effective elimination of wear on a tip sliding on a polymer surface over a distance of 750 m by modulating the force acting on the tip-sample contact. Friction measurements as a function of modulation frequency and amplitude indicate that a reduction of friction is responsible for the reduction in wear to below our detection limit. In addition to its relevance to data storage, this approach could also reduce wear in micro- and nanoelectromechanical systems and other applications of scanning probe microscopes.

Dynamic superlubricity and the elimination of wear on the nanoscale

Scanning force microscopy; with applications to electric, magnetic, and atomic forces

The effect of longitudinal tangential vibrations on friction and driving forces in sliding motion

Influence of ultrasonics on upsetting of a model paste

A reduction of friction by vibrations has been observed in various experiments This effect can be applied to actively control frictional forces by modulating vibrations Moreover, common methods of controlling friction rely on lubricants and suitable material combinations The superimposition of vibrations can further reduce the friction force This study presents a theoretical approach based on the Dahl friction model that describes the friction reduction observed in the presence of the tangential vibrations at an arbitrary angle Analysis results indicated that the tangential compliance should be considered in modeling the effect of vibrations in reducing friction At any vibration angle, the tangential compliance of the contacts reduces the friction reduction effect The vibrations parallel to the macroscopic velocity are most effective for friction reduction

https://ir.nctu.edu.tw:443/bitstream/11536/12763/1/000234308800007.pdf

The effect of friction reduction in the presence of in-plane vibrations

We present a study of the origin of ultrasound-induced friction reduction in microscopic mechanical contacts. The effect of friction reduction caused by Rayleigh-type surface acoustic waves (SAWs) is demonstrated for propagating and two-dimensional, standing wave fields using lateral force microscopy (LFM). It is shown that with increasing wave amplitude, friction is completely suppressed. To detect and distinguish between the effect of lateral and vertical surface oscillation components on the cantilever movement, we employed multimode scanning acoustic force microscopy (SAFM). We found that the friction reduction effect is only due to the vertical oscillation component. Because this effect does not appear for purely in-plane polarized Love waves, we concluded that the mechanical diode effect is most probably responsible for the SAW-induced lubrication. This explanation is also supported by vertical and longitudinal SAFM measurements, which show that, in areas where friction is completely suppressed, low frequency vertical cantilever oscillations can still be observed, whereas lateral or torsional oscillations are no longer excited.

The origin of ultrasound-induced friction reduction in microscopic mechanical contacts

We present a detailed study of the influence of ultrasonic surface acoustic waves (SAWs) on point-contact friction. Lateral force microscopy (LFM) and multimode scanning acoustic force microscopy (SAFM) were used to measure and to distinguish between the influence of in-plane and vertical surface oscillation components on the cantilever’s torsion and bending. The experiments show that friction can locally be suppressed by Rayleigh-type SAWs. Through the mapping of crossed standing wave fields, the wave amplitude dependence of the friction is visualized within microscopic areas without changing other experimental conditions. Above a certain wave amplitude threshold, friction vanishes completely. We found that the friction reduction effect is caused by the vertical oscillation components of the SAW. Purely in-plane polarized Love waves do not give rise to a significant friction reduction effect. Thus, we conclude that the mechanical diode effect, i.e., the effective shift of the cantilever off of the oscill...

Influence of surface acoustic waves on lateral forces in scanning force microscopies

We present an experimental method for the high-resolution imaging of the excitation and propagation of surface acoustic waves (SAWs) on anisotropic piezoelectric substrates. By employing a scanning acoustic force microscope (SAFM), we are able to image acoustic waves that are excitable by a single circular electrode pair source through the mixing with well-defined reference plane waves. We show amplitude and phase images of the point-source wave field, containing the angular dependence of the phase velocity of these modes, as well as their electromechanical coupling strength. The SAFM allows easy access to acoustic material properties, which are important for the design of commercial SAW devices.

High-resolution imaging of a single circular surface acoustic wave source: Effects of crystal anisotropy

We present scanning acoustic force microscopy (SAFM) mixing experiments of differently polarized surface acoustic waves (SAW) with noncollinear propagation directions. The phase velocities of the SAWs are measured at a submicron lateral scale, employing a multimode SAFM that is capable of detecting the wave’s normal and in-plane oscillation components. Hereby, the down conversion of the surface oscillations into cantilever vibrations due to the nonlinearity of the tip–sample interaction is utilized. The simultaneous determination of the phase velocities within a microscopic sample area is demonstrated for the mixing of Rayleigh and Love waves on the layered system SiO2/ST-cut quartz.

Simultaneous bimodal surface acoustic-wave velocity measurement by scanning acoustic force microscopy

We examine the scattering of surface acoustic waves (SAWs) by single dots, periodic and locally damped two-dimensional dot lattices. Employing the scanning acoustic force microscope, SAW fields are imaged with nanometer resolution. We study the influence of a roughly wavelength-sized single dot on SAW diffraction. In order to distinguish between forward- and backscattered components, we insonify the dot with the pump and probe beam under 0° and 90°. We furthermore analyze the SAW diffraction by a regular dot array. The wave field appears to be localized around the dots. Adding surface distortions, the regular SAW localization pattern brakes down in the vicinity of the distortion.

High-resolution imaging of surface acoustic wave scattering

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