F. Wei
University of Antwerp
3 Papers
1 Citations
F. Wei is an academic researcher from University of Antwerp. The author has contributed to research in topics: XANES & Engineering. The author has an hindex of 2, co-authored 3 publications.
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Papers
Use of microscopic XRF for non‐destructive analysis in art and archaeometry
Koen Janssens,G. Vittiglio,I. Deraedt,A. Aerts,Bart Vekemans,Laszlo Vincze,F. Wei,I. De Ryck,O. Schalm,Freddy Adams,A. Rindby,Arndt Knöchel,Alexandre Simionovici,Anatoly Snigirev +13 more
TL;DR: In this article, various application possibilities of microscopic x-ray fluorescence and associated methods for the characterization and provenance analysis of objects and materials of cultural heritage value are discussed by means of a number of case studies.
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Suitability of polycapillary optics for focusing of monochromatic synchrotron radiation as used in trace level micro-XANES measurements
TL;DR: In this paper, a monolithic polycapillary half-lens was evaluated as a micro-focusing device for monochromatic synchrotron radiation, and the tested optic produced an X-ray micro-beam of 37-53 microns in the energy range of 6-19 keV with a maximum intensity gain of about 600 with respect to the primary beam.