We present a new technique for High Purity Germanium (HPGe) Compton suppression using pulse shape analysis (PSA). The novel aspect of our approach involves a complete unfolding of the charge pulse shape into discrete components associated with individual γ-ray interactions. The information thus acquired is then used to favorably reject Compton escape events. The advantage of the current PSA approach, as compared with other recent approaches, is the potential to reject not only single-site escape events, but also multiple-site escape events. Here we discuss the details of our algorithm, and present experimental results from a real-time implementation on a 5 cm×5 cm HPGe. An experimental comparison with a standard BGO suppressor is also shown. In addition, we discuss the improvements to the current PSA approach which are possible if one can highly segment the outer contact of the HPGe.

/pdf/hpge-compton-suppression-using-pulse-shape-analysis-2eacw27cik.pdf

HPGe Compton suppression using pulse shape analysis

We present a new technique for High Purity Germanium (HPGe) Compton suppression using pulse shape analysis (PSA). The novel aspect of our approach involves a complete unfolding of the charge pulse shape into a discrete sum of component y-ray interactions. Using the energy and position information obtained from such an unfolding, an algorithm is then applied which favorably rejects Compton escape events. The advantage of the current PSA approach, as compared with other recent approaches, is the potential to reject not only single-site escape events, but also multiple site escape events. Here we discuss the details of our algorithm, and present experimental results from a real-time implementation on a 5 cm X 5 cm HPGe. An experimental comparison with a standard BGO suppresser is shown. We also discuss the possible improvements to the current PSA approach that could be obtained if the HPGe could be highly segmented on the outer contact.

/pdf/hpge-compton-suppression-using-pulse-shape-analysis-wn9ne82twd.pdf

HPGe compton suppression using pulse shape analysis

A set of analytical methods for pixelated 3D position sensitive semiconductor detectors has been developed to make better measurements of gamma-rays in the 30 keV to 3 MeV energy range. The ability to classify pixel charge sharing, x-ray escape, pair production, and Compton scattering allows for more accurate and efficient energy reconstruction and Compton imaging routines. The techniques are based on the analysis of digitized preamplifier waveforms from the electrodes that sense charge following an interaction. Accurate identification of an event is based on the comparison of an expected detector response with precise measurements of an interaction’s resulting signal amplitude, shape, and timing characteristics. A tungsten collimator is used to demonstrate the accuracy of the classification methods. Experimental results taken with large volume CZT and HgI 2 detectors are compared with system simulations.

/pdf/event-classification-in-3d-position-sensitive-semiconductor-30hcryofmq.pdf

Event classification in 3D position sensitive semiconductor detectors

Background recognition in germanium detectors by pulse shape analysis

A method of event identification that distinguishes single and multiple events by determining the number of interactions in a high purity germanium detector is presented. The selectivity of the method has been experimentally verified.

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Background recognition in germanium detectors by pulse shape analysis

Background recognition in germanium detectors by pulse shape analysis