The invention discloses a radiation rate control device and a radiation rate control method and relates to the measurement application field. In the prior art, a radiation rate adopted during measurement is determined through manually setting in a thermal imager according to a radiation rate table corresponding to various kinds of materials. When the temperature of a measured object is in a changing state, the radiation rates of several kinds of materials are changed along with the change of the temperature. The determination of the radiation rate of the material at the moment is difficult. The radiation rate control device determines the second radiation rate of the measured object according to the corresponding relation of first analysis data and the radiation rate. A problem existing inthe prior art is solved.

Radiation rate control device and radiation rate control method

The invention discloses a high-precision testing method for infrared emittance. Through a mechanical device, a standard reference black body is accurately moved to be within a view field range of a radiometer to be measured, it is avoided that ambient environment temperature changes and stray light have bad influences on testing results, and the precision of testing is improved; the mechanical device is a mechanical arm capable of conducting accurate positioning on automatic control. During testing, position information is recorded so as to be controlled accurately so that position informationtested by two persons can be identical as much as possible, and meanwhile, during calculating, errors caused by elimination of the position information are eliminated. During detecting, the to-be-tested object is accurately moved to be within the view field range of the radiometer to be tested, meanwhile, the position information during testing is recorded in real time, the measurement errors, caused by the ambient environment changes and stray light, of radiation signals generated during testing are avoided, the precision of testing the infrared emittance is improved, and practicability is good.

High-precision testing method for infrared emittance

The invention discloses a minimum temperature resolution testing device and a testing method. The current variable temperature difference object generator has relatively serious temperature different adjustment problem, which limits the minimum temperature difference and the maximum temperature difference which are generated by a temperature difference generator. The core of the invention is an appearance temperature difference generator which is of a combination type multi-rectangle cavity structure. The temperature difference generation device having the structure can be used as a radiation source approximating to a gray body, the emission rate on the surface of each unit is different, and a mixed surface with various emission rates distributed on is formed by combining the units. The emission rate of the unit surface can be adjusted through changing the manufacture material of the emission device, changing the depth-width ratio of the rectangle cavity, and changing duty ratio of the cavity-surface-area and the non-cavity-area on the horizontal plane of the cavity. In a certain range of the temperature and the spectrum, the invention has the characteristic of the gray body radiation, and not only can solve the temperature difference regulation, but can also be used as a target for infrared imaging system performance test and as a reference object for material emission rate measurement.

Minimum temperature resolution testing device and testing method

The invention discloses a method for detecting the high-density packaging electronic assembly emissivity. The method comprises the step of controlling the temperature of a temperature control box to enable the temperature of an electronic assembly to be stabilized around the preset value, the step of acquiring reflected apparent temperature of components to be detected, the step of serving the acquired reflected apparent temperature of the components to be detected as compensation to the environment reflected temperature of the components to be detected, the step of respectively adjusting the emissivity of the components to be detected and detecting the temperature of the components to be detected, and the step of serving the adjustment value of the emissivity as the detecting value of the emissivity of the components to be detected when the temperature of the components to be detected is equal to the preset value. The infrared thermography detection mode and the reflected temperature compensation control technology are adopted in the method, the apparent temperature and the actual temperature of the components inside the electronic assembly are effectively detected, the emissivity of the components to be detected can be detected and modified by compensating the reflected temperature of the components to be detected, and the purpose of detecting the emissivity of the electronic assembly which is assembled in a high-density mode and is complex in packaging structure is achieved.

Method for detecting high-density packaging electronic assembly emissivity

The invention discloses a system for detecting the transmitting rate of an electronic assembly. The system comprises a temperature regulating system and a thermal imager, wherein the temperature regulating system comprises a thermostat and a temperature control unit, the electronic assembly is isolated from an external environment by the thermostat, the temperature of the electronic assembly is regulated by the temperature control unit based on the heat convection of air, an infrared detection window is formed in the thermostat, and the thermal imager is used for detecting the infrared irradiation energy of the electronic assembly through the infrared detection window. Through the application of the system provided by the invention, the electronic assembly is isolated from the external environment by the thermostat, the temperature of the electronic assembly which consists of elements made from various materials is regulated by the temperature control unit based on the heat convection of the air, and the infrared detection window is formed in the thermostat, so that the accurate regulation of the temperatures of all parts of the electronic assembly is realized; meanwhile, various materials are synchronously measured, and the accuracy of the obtained transmitting rate can be improved.

System for detecting transmitting rate of electronic assembly

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Method for detecting high-density packaging electronic assembly emissivity

System for detecting transmitting rate of electronic assembly