En Yang
Carnegie Mellon University
18 Papers
110 Citations
En Yang is an academic researcher from Carnegie Mellon University. The author has contributed to research in topics: Thin film & Grain size. The author has an hindex of 11, co-authored 18 publications. Previous affiliations of En Yang include Western Digital.
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Papers
Bit-Patterned Magnetic Recording: Theory, Media Fabrication, and Recording Performance
Thomas R. Albrecht,Hitesh Arora,Vipin Ayanoor-Vitikkate,J.-M. L. Beaujour,Daniel Bedau,David Berman,Alexei Bogdanov,Yves-Andre Chapuis,Julia D. Cushen,E. Dobisz,Gregory S. Doerk,He Gao,Michael Grobis,Bruce A. Gurney,Weldon Mark Hanson,Olav Hellwig,Toshiki Hirano,Pierre-Olivier Jubert,Dan S. Kercher,Jeffrey S. Lille,Zuwei Liu,C. Mathew Mate,Yuri N. Obukhov,Kanaiyalal C. Patel,Kurt A. Rubin,Ricardo Ruiz,Manfred Ernst Schabes,Lei Wan,Dieter Weller,Tsai-Wei Wu,En Yang +30 more
TL;DR: In this article, a bit-patterned media (BPM) fabrication method was proposed for magnetic data recording at > 1 Tb/in 2 and circumvents many of the challenges associated with extending conventional granular media technology.
510
L10 FePt-oxide columnar perpendicular media with high coercivity and small grain size
En Yang,David E. Laughlin +1 more
TL;DR: In this article, the authors used alternating sputtering of FePt and oxide at 475°C to obtain uniform and well-isolated columnar grains with coercivity as high as 7kOe.
88
Correction of Order Parameter Calculations for FePt Perpendicular Thin Films
TL;DR: In this paper, the authors present an analysis of the order parameter calculation in FePt L10 thin films taking into account the geometric features of the X-ray diffractometer, the crystallographic texture of FePts films, and the finite thickness of the films.
87
Columnar grain growth of FePt(L10) thin films
TL;DR: In this article, an experimental approach for obtaining perpendicular FePt-SiOx thin films with a large height to diameter ratio of columnar grains is presented, where the microstructure of the composite thin films as a function of oxide volume fraction, substrate temperature, and film thickness is studied by plan view and cross section TEM.
39
Structure and magnetic properties of l10-fept thin films on tin/rual underlayers
TL;DR: In this article, the grain size defining underlayers were introduced to encourage the epitaxial and small grain growth from the RuAl/TiN underlayer, which resulted in small and uniform grains in the FePt layer with perpendicular texture.